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Quantitative Deviation of Nanocrystals Using the RIR Method in X-ray Diffraction (XRD)
The reference intensity ratio (RIR) method, using X-ray diffraction (XRD), is considered one most of the rapid and convenient approaches for phase quantification in multi-phase mixture, in which nanocrystals are commonly contained in a mixture and cause a broadening of the diffraction peak, while an...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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MDPI
2022
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9325253/ https://www.ncbi.nlm.nih.gov/pubmed/35889545 http://dx.doi.org/10.3390/nano12142320 |