Effects of Annealing and Thickness of Co(60)Fe(20)Yb(20) Nanofilms on Their Structure, Magnetic Properties, Electrical Efficiency, and Nanomechanical Characteristics

X-ray diffraction (XRD) analysis showed that metal oxide peaks appear at 2θ = 47.7°, 54.5°, and 56.3°, corresponding to Yb(2)O(3) (440), Co(2)O(3) (422), and Co(2)O(3) (511). It was found that oxide formation plays an important role in magnetic, electrical, and surface energy. For magnetic and electrical measurements, the highest alternating current magnetic susceptibility (χ(ac)) and the lowest resistivity (×10(−2) Ω·cm) were 0.213 and 0.42, respectively, and at 50 nm, it annealed at 300 °C due to weak oxide formation. For mechanical measurement, the highest value of hardness was 15.93 GPa at 200 °C in a 50 nm thick film. When the thickness increased from 10 to 50 nm, the hardness and Young’s modulus of the Co(60)Fe(20)Yb(20) film also showed a saturation trend. After annealing at 300 °C, Co(60)Fe(20)Yb(20) films of 40 nm thickness showed the highest surface energy. Higher surface energy indicated stronger adhesion, allowing for the formation of multilayer thin films. The optimal condition was found to be 50 nm with annealing at 300 °C due to high χ(ac), strong adhesion, high nano-mechanical properties, and low resistivity.