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Experimental Investigation of Relationship between Humidity Conditions and Degradation of Key Specifications of 0.1–1.2 GHz PA in 0.18 μm CMOS

The specification of power amplifiers (PA) is closely related to humidity variation, and few reports on the humidity properties of PA are available in the literature. Therefore, an experimental study of PA specifications was conducted under different humidity conditions to elucidate the relationship...

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Detalles Bibliográficos
Autores principales: Zhou, Shaohua, Yang, Cheng, Wang, Jian
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9329907/
https://www.ncbi.nlm.nih.gov/pubmed/35893160
http://dx.doi.org/10.3390/mi13081162
_version_ 1784758030359855104
author Zhou, Shaohua
Yang, Cheng
Wang, Jian
author_facet Zhou, Shaohua
Yang, Cheng
Wang, Jian
author_sort Zhou, Shaohua
collection PubMed
description The specification of power amplifiers (PA) is closely related to humidity variation, and few reports on the humidity properties of PA are available in the literature. Therefore, an experimental study of PA specifications was conducted under different humidity conditions to elucidate the relationship between the degradation of PA specifications and humidity conditions. This paper studies and provides results of the degradation of a PA subjected to different humidity levels. The experimental results show that the S(21) and output power decrease with the increase in humidity. The main cause of this degradation is the decrease in oxide capacitance and increase in threshold voltage with increasing humidity, resulting in a reduction of transconductance and an increase in on-resistance. The results of this study can guide designers in designing compensation circuits to achieve some degree of compensation for the degradation of PA specifications.
format Online
Article
Text
id pubmed-9329907
institution National Center for Biotechnology Information
language English
publishDate 2022
publisher MDPI
record_format MEDLINE/PubMed
spelling pubmed-93299072022-07-29 Experimental Investigation of Relationship between Humidity Conditions and Degradation of Key Specifications of 0.1–1.2 GHz PA in 0.18 μm CMOS Zhou, Shaohua Yang, Cheng Wang, Jian Micromachines (Basel) Article The specification of power amplifiers (PA) is closely related to humidity variation, and few reports on the humidity properties of PA are available in the literature. Therefore, an experimental study of PA specifications was conducted under different humidity conditions to elucidate the relationship between the degradation of PA specifications and humidity conditions. This paper studies and provides results of the degradation of a PA subjected to different humidity levels. The experimental results show that the S(21) and output power decrease with the increase in humidity. The main cause of this degradation is the decrease in oxide capacitance and increase in threshold voltage with increasing humidity, resulting in a reduction of transconductance and an increase in on-resistance. The results of this study can guide designers in designing compensation circuits to achieve some degree of compensation for the degradation of PA specifications. MDPI 2022-07-22 /pmc/articles/PMC9329907/ /pubmed/35893160 http://dx.doi.org/10.3390/mi13081162 Text en © 2022 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Zhou, Shaohua
Yang, Cheng
Wang, Jian
Experimental Investigation of Relationship between Humidity Conditions and Degradation of Key Specifications of 0.1–1.2 GHz PA in 0.18 μm CMOS
title Experimental Investigation of Relationship between Humidity Conditions and Degradation of Key Specifications of 0.1–1.2 GHz PA in 0.18 μm CMOS
title_full Experimental Investigation of Relationship between Humidity Conditions and Degradation of Key Specifications of 0.1–1.2 GHz PA in 0.18 μm CMOS
title_fullStr Experimental Investigation of Relationship between Humidity Conditions and Degradation of Key Specifications of 0.1–1.2 GHz PA in 0.18 μm CMOS
title_full_unstemmed Experimental Investigation of Relationship between Humidity Conditions and Degradation of Key Specifications of 0.1–1.2 GHz PA in 0.18 μm CMOS
title_short Experimental Investigation of Relationship between Humidity Conditions and Degradation of Key Specifications of 0.1–1.2 GHz PA in 0.18 μm CMOS
title_sort experimental investigation of relationship between humidity conditions and degradation of key specifications of 0.1–1.2 ghz pa in 0.18 μm cmos
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9329907/
https://www.ncbi.nlm.nih.gov/pubmed/35893160
http://dx.doi.org/10.3390/mi13081162
work_keys_str_mv AT zhoushaohua experimentalinvestigationofrelationshipbetweenhumidityconditionsanddegradationofkeyspecificationsof0112ghzpain018mmcmos
AT yangcheng experimentalinvestigationofrelationshipbetweenhumidityconditionsanddegradationofkeyspecificationsof0112ghzpain018mmcmos
AT wangjian experimentalinvestigationofrelationshipbetweenhumidityconditionsanddegradationofkeyspecificationsof0112ghzpain018mmcmos