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Experimental Investigation of Relationship between Humidity Conditions and Degradation of Key Specifications of 0.1–1.2 GHz PA in 0.18 μm CMOS
The specification of power amplifiers (PA) is closely related to humidity variation, and few reports on the humidity properties of PA are available in the literature. Therefore, an experimental study of PA specifications was conducted under different humidity conditions to elucidate the relationship...
Autores principales: | , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9329907/ https://www.ncbi.nlm.nih.gov/pubmed/35893160 http://dx.doi.org/10.3390/mi13081162 |
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author | Zhou, Shaohua Yang, Cheng Wang, Jian |
author_facet | Zhou, Shaohua Yang, Cheng Wang, Jian |
author_sort | Zhou, Shaohua |
collection | PubMed |
description | The specification of power amplifiers (PA) is closely related to humidity variation, and few reports on the humidity properties of PA are available in the literature. Therefore, an experimental study of PA specifications was conducted under different humidity conditions to elucidate the relationship between the degradation of PA specifications and humidity conditions. This paper studies and provides results of the degradation of a PA subjected to different humidity levels. The experimental results show that the S(21) and output power decrease with the increase in humidity. The main cause of this degradation is the decrease in oxide capacitance and increase in threshold voltage with increasing humidity, resulting in a reduction of transconductance and an increase in on-resistance. The results of this study can guide designers in designing compensation circuits to achieve some degree of compensation for the degradation of PA specifications. |
format | Online Article Text |
id | pubmed-9329907 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2022 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-93299072022-07-29 Experimental Investigation of Relationship between Humidity Conditions and Degradation of Key Specifications of 0.1–1.2 GHz PA in 0.18 μm CMOS Zhou, Shaohua Yang, Cheng Wang, Jian Micromachines (Basel) Article The specification of power amplifiers (PA) is closely related to humidity variation, and few reports on the humidity properties of PA are available in the literature. Therefore, an experimental study of PA specifications was conducted under different humidity conditions to elucidate the relationship between the degradation of PA specifications and humidity conditions. This paper studies and provides results of the degradation of a PA subjected to different humidity levels. The experimental results show that the S(21) and output power decrease with the increase in humidity. The main cause of this degradation is the decrease in oxide capacitance and increase in threshold voltage with increasing humidity, resulting in a reduction of transconductance and an increase in on-resistance. The results of this study can guide designers in designing compensation circuits to achieve some degree of compensation for the degradation of PA specifications. MDPI 2022-07-22 /pmc/articles/PMC9329907/ /pubmed/35893160 http://dx.doi.org/10.3390/mi13081162 Text en © 2022 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Zhou, Shaohua Yang, Cheng Wang, Jian Experimental Investigation of Relationship between Humidity Conditions and Degradation of Key Specifications of 0.1–1.2 GHz PA in 0.18 μm CMOS |
title | Experimental Investigation of Relationship between Humidity Conditions and Degradation of Key Specifications of 0.1–1.2 GHz PA in 0.18 μm CMOS |
title_full | Experimental Investigation of Relationship between Humidity Conditions and Degradation of Key Specifications of 0.1–1.2 GHz PA in 0.18 μm CMOS |
title_fullStr | Experimental Investigation of Relationship between Humidity Conditions and Degradation of Key Specifications of 0.1–1.2 GHz PA in 0.18 μm CMOS |
title_full_unstemmed | Experimental Investigation of Relationship between Humidity Conditions and Degradation of Key Specifications of 0.1–1.2 GHz PA in 0.18 μm CMOS |
title_short | Experimental Investigation of Relationship between Humidity Conditions and Degradation of Key Specifications of 0.1–1.2 GHz PA in 0.18 μm CMOS |
title_sort | experimental investigation of relationship between humidity conditions and degradation of key specifications of 0.1–1.2 ghz pa in 0.18 μm cmos |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9329907/ https://www.ncbi.nlm.nih.gov/pubmed/35893160 http://dx.doi.org/10.3390/mi13081162 |
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