Position-Sensitive Bulk and Surface Element Analysis of Decorated Porcelain Artifacts

Non-destructive characterization of decorated porcelain artifacts requires the joint use of surface-analytical methods for the decorative surface pattern and methods of high penetration depth for bulk-representative chemical composition. In this research, we used position-sensitive X-ray Fluorescenc...

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Autores principales: Szentmiklósi, László, Maróti, Boglárka, Csákvári, Szabolcs, Calligaro, Thomas
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9330006/
https://www.ncbi.nlm.nih.gov/pubmed/35897537
http://dx.doi.org/10.3390/ma15155106
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author Szentmiklósi, László
Maróti, Boglárka
Csákvári, Szabolcs
Calligaro, Thomas
author_facet Szentmiklósi, László
Maróti, Boglárka
Csákvári, Szabolcs
Calligaro, Thomas
author_sort Szentmiklósi, László
collection PubMed
description Non-destructive characterization of decorated porcelain artifacts requires the joint use of surface-analytical methods for the decorative surface pattern and methods of high penetration depth for bulk-representative chemical composition. In this research, we used position-sensitive X-ray Fluorescence Spectrometry (XRF) and Prompt-gamma activation analysis (PGAA) for these purposes, assisted by 3D structured-light optical scanning and dual-energy X-ray radiography. The proper combination of the near-surface and bulk element composition data can shed light on raw material use and manufacturing technology of ceramics.
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spelling pubmed-93300062022-07-29 Position-Sensitive Bulk and Surface Element Analysis of Decorated Porcelain Artifacts Szentmiklósi, László Maróti, Boglárka Csákvári, Szabolcs Calligaro, Thomas Materials (Basel) Article Non-destructive characterization of decorated porcelain artifacts requires the joint use of surface-analytical methods for the decorative surface pattern and methods of high penetration depth for bulk-representative chemical composition. In this research, we used position-sensitive X-ray Fluorescence Spectrometry (XRF) and Prompt-gamma activation analysis (PGAA) for these purposes, assisted by 3D structured-light optical scanning and dual-energy X-ray radiography. The proper combination of the near-surface and bulk element composition data can shed light on raw material use and manufacturing technology of ceramics. MDPI 2022-07-22 /pmc/articles/PMC9330006/ /pubmed/35897537 http://dx.doi.org/10.3390/ma15155106 Text en © 2022 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Szentmiklósi, László
Maróti, Boglárka
Csákvári, Szabolcs
Calligaro, Thomas
Position-Sensitive Bulk and Surface Element Analysis of Decorated Porcelain Artifacts
title Position-Sensitive Bulk and Surface Element Analysis of Decorated Porcelain Artifacts
title_full Position-Sensitive Bulk and Surface Element Analysis of Decorated Porcelain Artifacts
title_fullStr Position-Sensitive Bulk and Surface Element Analysis of Decorated Porcelain Artifacts
title_full_unstemmed Position-Sensitive Bulk and Surface Element Analysis of Decorated Porcelain Artifacts
title_short Position-Sensitive Bulk and Surface Element Analysis of Decorated Porcelain Artifacts
title_sort position-sensitive bulk and surface element analysis of decorated porcelain artifacts
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9330006/
https://www.ncbi.nlm.nih.gov/pubmed/35897537
http://dx.doi.org/10.3390/ma15155106
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