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Dislocation substructures in pure aluminium after creep deformation as studied by electron backscatter diffraction
In the present work, electron backscatter diffraction was used to determine the microscopic dislocation structures generated during creep (with tests interrupted at the steady state) in pure 99.8% aluminium. This material was investigated at two different stress levels, corresponding to the power-la...
| Autores principales: | , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
International Union of Crystallography
2022
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9348881/ https://www.ncbi.nlm.nih.gov/pubmed/35974726 http://dx.doi.org/10.1107/S1600576722005209 |