Cargando…
The Radon transform as a tool for 3D reciprocal-space mapping of epitaxial microcrystals
This work presents a new approach suitable for mapping reciprocal space in three dimensions with standard laboratory equipment and a typical X-ray diffraction setup. The method is based on symmetric and coplanar high-resolution X-ray diffraction, ideally realized using 2D X-ray pixel detectors. The...
Autores principales: | Meduňa, Mojmír, Isa, Fabio, Bressan, Franco, von Känel, Hans |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
International Union of Crystallography
2022
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9348889/ https://www.ncbi.nlm.nih.gov/pubmed/35974728 http://dx.doi.org/10.1107/S1600576722004885 |
Ejemplares similares
-
Perfect crystals grown from imperfect interfaces
por: Falub, Claudiu V., et al.
Publicado: (2013) -
Self-Assembly of Nanovoids in Si Microcrystals Epitaxially
Grown on Deeply Patterned Substrates
por: Barzaghi, Andrea, et al.
Publicado: (2020) -
The Radon transform
por: Helgason, Sigurdur
Publicado: (1999) -
The Radon transform
por: Helgason, Sigurdur
Publicado: (1980) -
A look inside epitaxial cobalt-on-fluorite nanoparticles with three-dimensional reciprocal space mapping using GIXD, RHEED and GISAXS
por: Suturin, S. M., et al.
Publicado: (2013)