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Deep learning-based noise filtering toward millisecond order imaging by using scanning transmission electron microscopy
Application of scanning transmission electron microscopy (STEM) to in situ observation will be essential in the current and emerging data-driven materials science by taking STEM’s high affinity with various analytical options into account. As is well known, STEM’s image acquisition time needs to be...
| Autores principales: | , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2022
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9356044/ https://www.ncbi.nlm.nih.gov/pubmed/35931705 http://dx.doi.org/10.1038/s41598-022-17360-3 |