Direct Conversion X-ray Detector with Micron-Scale Pixel Pitch for Edge-Illumination and Propagation-Based X-ray Phase-Contrast Imaging

In this work, we investigate the potential of employing a direct conversion integration mode X-ray detector with micron-scale pixels in two different X-ray phase-contrast imaging (XPCi) configurations, propagation-based (PB) and edge illumination (EI). Both PB-XPCi and EI-XPCi implementations are ev...

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Detalles Bibliográficos
Autores principales: Pil-Ali, Abdollah, Adnani, Sahar, Scott, Christopher C., Karim, Karim S.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9371434/
https://www.ncbi.nlm.nih.gov/pubmed/35957449
http://dx.doi.org/10.3390/s22155890

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9371434/
https://www.ncbi.nlm.nih.gov/pubmed/35957449
http://dx.doi.org/10.3390/s22155890

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