A Compact Measurement Setup for Material Characterization in W-Band Based on Dielectric Waveguides

In this contribution, we present a measurement system for material characterization in the millimeter-wave range that requires extremely small amounts of sample material. With the help of a dielectric waveguide, it is possible to measure the complete S-parameters with only one port. Fundamentals reg...

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Detalles Bibliográficos
Autores principales: Orend, Kerstin, Baer, Christoph, Musch, Thomas
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9415312/
https://www.ncbi.nlm.nih.gov/pubmed/36015733
http://dx.doi.org/10.3390/s22165972

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9415312/
https://www.ncbi.nlm.nih.gov/pubmed/36015733
http://dx.doi.org/10.3390/s22165972

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