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A Compact Measurement Setup for Material Characterization in W-Band Based on Dielectric Waveguides
In this contribution, we present a measurement system for material characterization in the millimeter-wave range that requires extremely small amounts of sample material. With the help of a dielectric waveguide, it is possible to measure the complete S-parameters with only one port. Fundamentals reg...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2022
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9415312/ https://www.ncbi.nlm.nih.gov/pubmed/36015733 http://dx.doi.org/10.3390/s22165972 |