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Insights into dynamic sliding contacts from conductive atomic force microscopy
Friction in nanoscale contacts is determined by the size and structure of the interface that is hidden between the contacting bodies. One approach to investigating the origins of friction is to measure electrical conductivity as a proxy for contact size and structure. However, the relationships betw...
Autores principales: | Chan, Nicholas, Vazirisereshk, Mohammad R., Martini, Ashlie, Egberts, Philip |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
RSC
2020
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9417200/ https://www.ncbi.nlm.nih.gov/pubmed/36132756 http://dx.doi.org/10.1039/d0na00414f |
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