Nanoscale characterization of an all-oxide core–shell nanorod heterojunction using intermodulation atomic force microscopy (AFM) methods

The electrical properties of an all-oxide core–shell ZnO–Co(3)O(4) nanorod heterojunction were studied in the dark and under UV-vis illumination. The contact potential difference and current distribution maps were obtained utilizing new methods in dynamic multifrequency atomic force microscopy (AFM) such as electrostatic and conductive intermodulation AFM. Light irradiation modified the electrical properties of the nanorod heterojunction. The new techniques are able to follow the instantaneous local variation of the photocurrent, giving a two-dimensional (2D) map of the current–voltage curves and correlating the electrical and morphological features of the heterostructured core–shell nanorods.