The dimensional crossover of quantum transport properties in few-layered Bi(2)Se(3) thin films

Topological insulator bismuth selenide (Bi(2)Se(3)) thin films with a thickness of 6.0 quintuple layers (QL) to 23 QL are deposited using pulsed laser deposition (PLD). The arithmetical mean deviation of the roughness (R(a)) of these films is less than 0.5 nm, and the root square mean deviation of t...

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Detalles Bibliográficos
Autores principales: Yang, Liang, Wang, Zhenhua, Li, Mingze, Gao, Xuan P. A., Zhang, Zhidong
Formato: Online Artículo Texto
Lenguaje:English
Publicado: RSC 2019
Materias:
Chemistry
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9418712/
https://www.ncbi.nlm.nih.gov/pubmed/36131963
http://dx.doi.org/10.1039/c9na00036d

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9418712/
https://www.ncbi.nlm.nih.gov/pubmed/36131963
http://dx.doi.org/10.1039/c9na00036d

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