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The dimensional crossover of quantum transport properties in few-layered Bi(2)Se(3) thin films
Topological insulator bismuth selenide (Bi(2)Se(3)) thin films with a thickness of 6.0 quintuple layers (QL) to 23 QL are deposited using pulsed laser deposition (PLD). The arithmetical mean deviation of the roughness (R(a)) of these films is less than 0.5 nm, and the root square mean deviation of t...
Autores principales: | Yang, Liang, Wang, Zhenhua, Li, Mingze, Gao, Xuan P. A., Zhang, Zhidong |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
RSC
2019
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9418712/ https://www.ncbi.nlm.nih.gov/pubmed/36131963 http://dx.doi.org/10.1039/c9na00036d |
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