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Phase change thin films for non-volatile memory applications

The rapid development of Internet of Things devices requires real time processing of a huge amount of digital data, creating a new demand for computing technology. Phase change memory technology based on chalcogenide phase change materials meets many requirements of the emerging memory applications...

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Detalles Bibliográficos
Autores principales: Lotnyk, A., Behrens, M., Rauschenbach, B.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: RSC 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9419560/
https://www.ncbi.nlm.nih.gov/pubmed/36132100
http://dx.doi.org/10.1039/c9na00366e
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author Lotnyk, A.
Behrens, M.
Rauschenbach, B.
author_facet Lotnyk, A.
Behrens, M.
Rauschenbach, B.
author_sort Lotnyk, A.
collection PubMed
description The rapid development of Internet of Things devices requires real time processing of a huge amount of digital data, creating a new demand for computing technology. Phase change memory technology based on chalcogenide phase change materials meets many requirements of the emerging memory applications since it is fast, scalable and non-volatile. In addition, phase change memory offers multilevel data storage and can be applied both in neuro-inspired and all-photonic in-memory computing. Furthermore, phase change alloys represent an outstanding class of functional materials having a tremendous variety of industrially relevant characteristics and exceptional material properties. Many efforts have been devoted to understanding these properties with the particular aim to design universal memory. This paper reviews materials science aspects of chalcogenide-based phase change thin films relevant for non-volatile memory applications. Particular emphasis is put on local structure, control of disorder and its impact on material properties, order–disorder transitions and interfacial transformations.
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spelling pubmed-94195602022-09-20 Phase change thin films for non-volatile memory applications Lotnyk, A. Behrens, M. Rauschenbach, B. Nanoscale Adv Chemistry The rapid development of Internet of Things devices requires real time processing of a huge amount of digital data, creating a new demand for computing technology. Phase change memory technology based on chalcogenide phase change materials meets many requirements of the emerging memory applications since it is fast, scalable and non-volatile. In addition, phase change memory offers multilevel data storage and can be applied both in neuro-inspired and all-photonic in-memory computing. Furthermore, phase change alloys represent an outstanding class of functional materials having a tremendous variety of industrially relevant characteristics and exceptional material properties. Many efforts have been devoted to understanding these properties with the particular aim to design universal memory. This paper reviews materials science aspects of chalcogenide-based phase change thin films relevant for non-volatile memory applications. Particular emphasis is put on local structure, control of disorder and its impact on material properties, order–disorder transitions and interfacial transformations. RSC 2019-09-18 /pmc/articles/PMC9419560/ /pubmed/36132100 http://dx.doi.org/10.1039/c9na00366e Text en This journal is © The Royal Society of Chemistry https://creativecommons.org/licenses/by/3.0/
spellingShingle Chemistry
Lotnyk, A.
Behrens, M.
Rauschenbach, B.
Phase change thin films for non-volatile memory applications
title Phase change thin films for non-volatile memory applications
title_full Phase change thin films for non-volatile memory applications
title_fullStr Phase change thin films for non-volatile memory applications
title_full_unstemmed Phase change thin films for non-volatile memory applications
title_short Phase change thin films for non-volatile memory applications
title_sort phase change thin films for non-volatile memory applications
topic Chemistry
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9419560/
https://www.ncbi.nlm.nih.gov/pubmed/36132100
http://dx.doi.org/10.1039/c9na00366e
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