X-ray directional dark-field imaging using Unified Modulated Pattern Analysis

X-ray directional dark-field imaging is a recent technique that can reveal a sample’s small-scale structural properties which are otherwise invisible in a conventional imaging system. In particular, directional dark-field can detect and quantify the orientation of anisotropic structures. Here, we pr...

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Detalles Bibliográficos
Autores principales: Smith, Ronan, De Marco, Fabio, Broche, Ludovic, Zdora, Marie-Christine, Phillips, Nicholas W., Boardman, Richard, Thibault, Pierre
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Public Library of Science 2022
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9423625/
https://www.ncbi.nlm.nih.gov/pubmed/36037163
http://dx.doi.org/10.1371/journal.pone.0273315

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9423625/
https://www.ncbi.nlm.nih.gov/pubmed/36037163
http://dx.doi.org/10.1371/journal.pone.0273315

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