A new Kirkpatrick–Baez-based scanning microscope for the Submicron Resolution X-ray Spectroscopy (SRX) beamline at NSLS-II

The development, construction, and first commissioning results of a new scanning microscope installed at the 5-ID Submicron Resolution X-ray Spectroscopy (SRX) beamline at NSLS-II are reported. The developed system utilizes Kirkpatrick–Baez mirrors for X-ray focusing. The instrument is designed to e...

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Detalles Bibliográficos
Autores principales: Nazaretski, E., Coburn, D. S., Xu, W., Ma, J., Xu, H., Smith, R., Huang, X., Yang, Y., Huang, L., Idir, M., Kiss, A., Chu, Y. S.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2022
Materias:
Beamlines
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9455213/
https://www.ncbi.nlm.nih.gov/pubmed/36073888
http://dx.doi.org/10.1107/S1600577522007056

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