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Indexing of superimposed Laue diffraction patterns using a dictionary–branch–bound approach

X-ray Laue diffraction is an important method for characterizing the local crystallographic orientation and elastic strain in polycrystalline materials. Existing analysis methods are designed mainly to index a single or a few Laue diffraction pattern(s) recorded in a detector image. In this work, a...

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Detalles Bibliográficos
Autores principales: Seret, Anthony, Gao, Wenqiang, Juul Jensen, Dorte, Godfrey, Andy, Zhang, Yubin
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9533744/
https://www.ncbi.nlm.nih.gov/pubmed/36249500
http://dx.doi.org/10.1107/S1600576722006021

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