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Describing small-angle scattering profiles by a limited set of intensities
Small-angle scattering (SAS) probes the size and shape of particles at low resolution through the analysis of the scattering of X-rays or neutrons passing through a solution of particles. One approach to extracting structural information from SAS data is the indirect Fourier transform (IFT). The IFT...
Autor principal: | Grant, Thomas D. |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
International Union of Crystallography
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9533761/ https://www.ncbi.nlm.nih.gov/pubmed/36249494 http://dx.doi.org/10.1107/S1600576722006598 |
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