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Describing small-angle scattering profiles by a limited set of intensities

Small-angle scattering (SAS) probes the size and shape of particles at low resolution through the analysis of the scattering of X-rays or neutrons passing through a solution of particles. One approach to extracting structural information from SAS data is the indirect Fourier transform (IFT). The IFT...

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Detalles Bibliográficos
Autor principal: Grant, Thomas D.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9533761/
https://www.ncbi.nlm.nih.gov/pubmed/36249494
http://dx.doi.org/10.1107/S1600576722006598

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