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Scaling behavior of InAlN/GaN HEMTs on silicon for RF applications

Due to the low cost and the scaling capability of Si substrate, InAlN/GaN high-electron-mobility transistors (HEMTs) on silicon substrate have attracted more and more attentions. In this paper, a high-performance 50-nm-gate-length InAlN/GaN HEMT on Si with a high on/off current (I(on)/I(off)) ratio...

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Detalles Bibliográficos
Autores principales: Cui, Peng, Zeng, Yuping
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9537168/
https://www.ncbi.nlm.nih.gov/pubmed/36202953
http://dx.doi.org/10.1038/s41598-022-21092-9