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Microstructural Origin of the High-Energy Storage Performance in Epitaxial Lead-Free Ba(Zr(0.2)Ti(0.8))O(3) Thick Films

In our previous work, epitaxial Ba(Zr(0.2)Ti(0.8))O(3) thick films (~1–2 μm) showed an excellent energy storage performance with a large recyclable energy density (~58 J/cc) and a high energy efficiency (~92%), which was attributed to a nanoscale entangled heterophase polydomain structure. Here, we...

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Autores principales: Ouyang, Jun, Wang, Xianke, Shao, Changtao, Cheng, Hongbo, Zhu, Hanfei, Ren, Yuhang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9573558/
https://www.ncbi.nlm.nih.gov/pubmed/36234119
http://dx.doi.org/10.3390/ma15196778
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author Ouyang, Jun
Wang, Xianke
Shao, Changtao
Cheng, Hongbo
Zhu, Hanfei
Ren, Yuhang
author_facet Ouyang, Jun
Wang, Xianke
Shao, Changtao
Cheng, Hongbo
Zhu, Hanfei
Ren, Yuhang
author_sort Ouyang, Jun
collection PubMed
description In our previous work, epitaxial Ba(Zr(0.2)Ti(0.8))O(3) thick films (~1–2 μm) showed an excellent energy storage performance with a large recyclable energy density (~58 J/cc) and a high energy efficiency (~92%), which was attributed to a nanoscale entangled heterophase polydomain structure. Here, we propose a detailed analysis of the structure–property relationship in these film materials, using an annealing process to illustrate the effect of nanodomain entanglement on the energy storage performance. It is revealed that an annealing-induced stress relaxation led to the segregation of the nanodomains (via detailed XRD analyses), and a degraded energy storage performance (via polarization-electric field analysis). These results confirm that a nanophase entanglement is an origin of the high-energy storage performance in the Ba(Zr(0.2)Ti(0.8))O(3) thick films.
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spelling pubmed-95735582022-10-17 Microstructural Origin of the High-Energy Storage Performance in Epitaxial Lead-Free Ba(Zr(0.2)Ti(0.8))O(3) Thick Films Ouyang, Jun Wang, Xianke Shao, Changtao Cheng, Hongbo Zhu, Hanfei Ren, Yuhang Materials (Basel) Article In our previous work, epitaxial Ba(Zr(0.2)Ti(0.8))O(3) thick films (~1–2 μm) showed an excellent energy storage performance with a large recyclable energy density (~58 J/cc) and a high energy efficiency (~92%), which was attributed to a nanoscale entangled heterophase polydomain structure. Here, we propose a detailed analysis of the structure–property relationship in these film materials, using an annealing process to illustrate the effect of nanodomain entanglement on the energy storage performance. It is revealed that an annealing-induced stress relaxation led to the segregation of the nanodomains (via detailed XRD analyses), and a degraded energy storage performance (via polarization-electric field analysis). These results confirm that a nanophase entanglement is an origin of the high-energy storage performance in the Ba(Zr(0.2)Ti(0.8))O(3) thick films. MDPI 2022-09-30 /pmc/articles/PMC9573558/ /pubmed/36234119 http://dx.doi.org/10.3390/ma15196778 Text en © 2022 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Ouyang, Jun
Wang, Xianke
Shao, Changtao
Cheng, Hongbo
Zhu, Hanfei
Ren, Yuhang
Microstructural Origin of the High-Energy Storage Performance in Epitaxial Lead-Free Ba(Zr(0.2)Ti(0.8))O(3) Thick Films
title Microstructural Origin of the High-Energy Storage Performance in Epitaxial Lead-Free Ba(Zr(0.2)Ti(0.8))O(3) Thick Films
title_full Microstructural Origin of the High-Energy Storage Performance in Epitaxial Lead-Free Ba(Zr(0.2)Ti(0.8))O(3) Thick Films
title_fullStr Microstructural Origin of the High-Energy Storage Performance in Epitaxial Lead-Free Ba(Zr(0.2)Ti(0.8))O(3) Thick Films
title_full_unstemmed Microstructural Origin of the High-Energy Storage Performance in Epitaxial Lead-Free Ba(Zr(0.2)Ti(0.8))O(3) Thick Films
title_short Microstructural Origin of the High-Energy Storage Performance in Epitaxial Lead-Free Ba(Zr(0.2)Ti(0.8))O(3) Thick Films
title_sort microstructural origin of the high-energy storage performance in epitaxial lead-free ba(zr(0.2)ti(0.8))o(3) thick films
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9573558/
https://www.ncbi.nlm.nih.gov/pubmed/36234119
http://dx.doi.org/10.3390/ma15196778
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