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Millimeter-Wave Permittivity Variations of an HR Silicon Substrate from the Photoconductive Effect
The photoinduced microwave complex permittivity of a highly resistive single-crystal silicon wafer was extracted from a bistatic free-space characterization test bench operating in the 26.5–40 GHz frequency band under CW optical illumination at wavelengths of 806 and 971 nm. Significant variations i...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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MDPI
2022
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9607626/ https://www.ncbi.nlm.nih.gov/pubmed/36296135 http://dx.doi.org/10.3390/mi13101782 |