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Revealing the pulse-induced electroplasticity by decoupling electron wind force
Micro/nano electromechanical systems and nanodevices often suffer from degradation under electrical pulse. However, the origin of pulse-induced degradation remains an open question. Herein, we investigate the defect dynamics in Au nanocrystals under pulse conditions. By decoupling the electron wind...
Autores principales: | , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9622885/ https://www.ncbi.nlm.nih.gov/pubmed/36316328 http://dx.doi.org/10.1038/s41467-022-34333-2 |
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author | Li, Xing Zhu, Qi Hong, Youran Zheng, He Wang, Jian Wang, Jiangwei Zhang, Ze |
author_facet | Li, Xing Zhu, Qi Hong, Youran Zheng, He Wang, Jian Wang, Jiangwei Zhang, Ze |
author_sort | Li, Xing |
collection | PubMed |
description | Micro/nano electromechanical systems and nanodevices often suffer from degradation under electrical pulse. However, the origin of pulse-induced degradation remains an open question. Herein, we investigate the defect dynamics in Au nanocrystals under pulse conditions. By decoupling the electron wind force via a properly-designed in situ TEM electropulsing experiment, we reveal a non-directional migration of Σ3{112} incoherent twin boundary upon electropulsing, in contrast to the expected directional migration under electron wind force. Quantitative analyses demonstrate that such exceptional incoherent twin boundary migration is governed by the electron-dislocation interaction that enhances the atom vibration at dislocation cores, rather than driven by the electron wind force in classic model. Our observations provide valuable insights into the origin of electroplasticity in metallic materials at the atomic level, which are of scientific and technological significances to understanding the electromigration and resultant electrical damage/failure in micro/nano-electronic devices. |
format | Online Article Text |
id | pubmed-9622885 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2022 |
publisher | Nature Publishing Group UK |
record_format | MEDLINE/PubMed |
spelling | pubmed-96228852022-11-02 Revealing the pulse-induced electroplasticity by decoupling electron wind force Li, Xing Zhu, Qi Hong, Youran Zheng, He Wang, Jian Wang, Jiangwei Zhang, Ze Nat Commun Article Micro/nano electromechanical systems and nanodevices often suffer from degradation under electrical pulse. However, the origin of pulse-induced degradation remains an open question. Herein, we investigate the defect dynamics in Au nanocrystals under pulse conditions. By decoupling the electron wind force via a properly-designed in situ TEM electropulsing experiment, we reveal a non-directional migration of Σ3{112} incoherent twin boundary upon electropulsing, in contrast to the expected directional migration under electron wind force. Quantitative analyses demonstrate that such exceptional incoherent twin boundary migration is governed by the electron-dislocation interaction that enhances the atom vibration at dislocation cores, rather than driven by the electron wind force in classic model. Our observations provide valuable insights into the origin of electroplasticity in metallic materials at the atomic level, which are of scientific and technological significances to understanding the electromigration and resultant electrical damage/failure in micro/nano-electronic devices. Nature Publishing Group UK 2022-10-31 /pmc/articles/PMC9622885/ /pubmed/36316328 http://dx.doi.org/10.1038/s41467-022-34333-2 Text en © The Author(s) 2022 https://creativecommons.org/licenses/by/4.0/Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/ (https://creativecommons.org/licenses/by/4.0/) . |
spellingShingle | Article Li, Xing Zhu, Qi Hong, Youran Zheng, He Wang, Jian Wang, Jiangwei Zhang, Ze Revealing the pulse-induced electroplasticity by decoupling electron wind force |
title | Revealing the pulse-induced electroplasticity by decoupling electron wind force |
title_full | Revealing the pulse-induced electroplasticity by decoupling electron wind force |
title_fullStr | Revealing the pulse-induced electroplasticity by decoupling electron wind force |
title_full_unstemmed | Revealing the pulse-induced electroplasticity by decoupling electron wind force |
title_short | Revealing the pulse-induced electroplasticity by decoupling electron wind force |
title_sort | revealing the pulse-induced electroplasticity by decoupling electron wind force |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9622885/ https://www.ncbi.nlm.nih.gov/pubmed/36316328 http://dx.doi.org/10.1038/s41467-022-34333-2 |
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