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Simulating dark-field X-ray microscopy images with wavefront propagation techniques

Dark-field X-ray microscopy is a diffraction-based synchrotron imaging technique capable of imaging defects in the bulk of extended crystalline samples. Numerical simulations are presented of image formation in such a microscope using numerical integration of the dynamical Takagi–Taupin equations an...

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Detalles Bibliográficos
Autores principales:	Carlsen, Mads, Detlefs, Carsten, Yildirim, Can, Ræder, Trygve, Simons, Hugh
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	International Union of Crystallography 2022
Materias:	Research Papers
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9624181/ https://www.ncbi.nlm.nih.gov/pubmed/36318069 http://dx.doi.org/10.1107/S205327332200866X

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