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Development of a method for calculating effective displacement damage doses in semiconductors and applications to space field

The displacement damage dose (DDD) is a common index used to predict the life of semiconductor devices employed in space-based environments where they will be exposed to radiation. The DDD is commonly estimated from the non-ionizing energy loss based on the Norgett-Robinson-Torrens (NRT) model, alth...

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Detalles Bibliográficos
Autores principales: Iwamoto, Yosuke, Sato, Tatsuhiko
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Public Library of Science 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9632926/
https://www.ncbi.nlm.nih.gov/pubmed/36327233
http://dx.doi.org/10.1371/journal.pone.0276364