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Statistical analysis of hard X-ray radiation at the PAL-XFEL facility performed by Hanbury Brown and Twiss interferometry

A Hanbury Brown and Twiss interferometry experiment based on second-order correlations was performed at the PAL-XFEL facility. The statistical properties of the X-ray radiation were studied within this experiment. Measurements were performed at the NCI beamline at 10 keV photon energy under various...

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Autores principales: Kim, Young Yong, Khubbutdinov, Ruslan, Carnis, Jerome, Kim, Sangsoo, Nam, Daewoong, Nam, Inhyuk, Kim, Gyujin, Shim, Chi Hyun, Yang, Haeryong, Cho, Myunghoon, Min, Chang-Ki, Kim, Changbum, Kang, Heung-Sik, Vartanyants, Ivan A.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9641567/
https://www.ncbi.nlm.nih.gov/pubmed/36345755
http://dx.doi.org/10.1107/S1600577522008773
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author Kim, Young Yong
Khubbutdinov, Ruslan
Carnis, Jerome
Kim, Sangsoo
Nam, Daewoong
Nam, Inhyuk
Kim, Gyujin
Shim, Chi Hyun
Yang, Haeryong
Cho, Myunghoon
Min, Chang-Ki
Kim, Changbum
Kang, Heung-Sik
Vartanyants, Ivan A.
author_facet Kim, Young Yong
Khubbutdinov, Ruslan
Carnis, Jerome
Kim, Sangsoo
Nam, Daewoong
Nam, Inhyuk
Kim, Gyujin
Shim, Chi Hyun
Yang, Haeryong
Cho, Myunghoon
Min, Chang-Ki
Kim, Changbum
Kang, Heung-Sik
Vartanyants, Ivan A.
author_sort Kim, Young Yong
collection PubMed
description A Hanbury Brown and Twiss interferometry experiment based on second-order correlations was performed at the PAL-XFEL facility. The statistical properties of the X-ray radiation were studied within this experiment. Measurements were performed at the NCI beamline at 10 keV photon energy under various operation conditions: self-amplified spontaneous emission (SASE), SASE with a monochromator, and self-seeding regimes at 120 pC, 180 pC and 200 pC electron bunch charge. Statistical analysis showed short average pulse duration from 6 fs to 9 fs depending on the operational conditions. A high spatial degree of coherence of about 70–80% was determined in the spatial domain for the SASE beams with the monochromator and self-seeding regime of operation. The obtained values describe the statistical properties of the beams generated at the PAL-XFEL facility.
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spelling pubmed-96415672022-11-14 Statistical analysis of hard X-ray radiation at the PAL-XFEL facility performed by Hanbury Brown and Twiss interferometry Kim, Young Yong Khubbutdinov, Ruslan Carnis, Jerome Kim, Sangsoo Nam, Daewoong Nam, Inhyuk Kim, Gyujin Shim, Chi Hyun Yang, Haeryong Cho, Myunghoon Min, Chang-Ki Kim, Changbum Kang, Heung-Sik Vartanyants, Ivan A. J Synchrotron Radiat Research Papers A Hanbury Brown and Twiss interferometry experiment based on second-order correlations was performed at the PAL-XFEL facility. The statistical properties of the X-ray radiation were studied within this experiment. Measurements were performed at the NCI beamline at 10 keV photon energy under various operation conditions: self-amplified spontaneous emission (SASE), SASE with a monochromator, and self-seeding regimes at 120 pC, 180 pC and 200 pC electron bunch charge. Statistical analysis showed short average pulse duration from 6 fs to 9 fs depending on the operational conditions. A high spatial degree of coherence of about 70–80% was determined in the spatial domain for the SASE beams with the monochromator and self-seeding regime of operation. The obtained values describe the statistical properties of the beams generated at the PAL-XFEL facility. International Union of Crystallography 2022-10-07 /pmc/articles/PMC9641567/ /pubmed/36345755 http://dx.doi.org/10.1107/S1600577522008773 Text en © Young Yong Kim et al. 2022 https://creativecommons.org/licenses/by/4.0/This is an open-access article distributed under the terms of the Creative Commons Attribution (CC-BY) Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.
spellingShingle Research Papers
Kim, Young Yong
Khubbutdinov, Ruslan
Carnis, Jerome
Kim, Sangsoo
Nam, Daewoong
Nam, Inhyuk
Kim, Gyujin
Shim, Chi Hyun
Yang, Haeryong
Cho, Myunghoon
Min, Chang-Ki
Kim, Changbum
Kang, Heung-Sik
Vartanyants, Ivan A.
Statistical analysis of hard X-ray radiation at the PAL-XFEL facility performed by Hanbury Brown and Twiss interferometry
title Statistical analysis of hard X-ray radiation at the PAL-XFEL facility performed by Hanbury Brown and Twiss interferometry
title_full Statistical analysis of hard X-ray radiation at the PAL-XFEL facility performed by Hanbury Brown and Twiss interferometry
title_fullStr Statistical analysis of hard X-ray radiation at the PAL-XFEL facility performed by Hanbury Brown and Twiss interferometry
title_full_unstemmed Statistical analysis of hard X-ray radiation at the PAL-XFEL facility performed by Hanbury Brown and Twiss interferometry
title_short Statistical analysis of hard X-ray radiation at the PAL-XFEL facility performed by Hanbury Brown and Twiss interferometry
title_sort statistical analysis of hard x-ray radiation at the pal-xfel facility performed by hanbury brown and twiss interferometry
topic Research Papers
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9641567/
https://www.ncbi.nlm.nih.gov/pubmed/36345755
http://dx.doi.org/10.1107/S1600577522008773
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