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Towards sub-millisecond cryo-EM grid preparation

Sample preparation is still a significant problem for many single particle cryo-EM workflows and our understanding and developments in the area lag behind that of image processing and microscope design. Over the last few years there has been growing evidence that many of the problems which occur dur...

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Detalles Bibliográficos
Autores principales: Klebl, David P., Kay, Robert W., Sobott, Frank, Kapur, Nikil, Muench, Stephen P.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: The Royal Society of Chemistry 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9642037/
https://www.ncbi.nlm.nih.gov/pubmed/35920384
http://dx.doi.org/10.1039/d2fd00079b

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