Cargando…
Crystallinity Effect on Electrical Properties of PEALD–HfO(2) Thin Films Prepared by Different Substrate Temperatures
Hafnium oxide (HfO(2)) thin film has remarkable physical and chemical properties, which makes it useful for a variety of applications. In this work, HfO(2) films were prepared on silicon through plasma enhanced atomic layer deposition (PEALD) at various substrate temperatures. The growth per cycle,...
Autores principales: | Zhang, Xiao-Ying, Han, Jing, Peng, Duan-Chen, Ruan, Yu-Jiao, Wu, Wan-Yu, Wuu, Dong-Sing, Huang, Chien-Jung, Lien, Shui-Yang, Zhu, Wen-Zhang |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2022
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9656191/ https://www.ncbi.nlm.nih.gov/pubmed/36364666 http://dx.doi.org/10.3390/nano12213890 |
Ejemplares similares
-
Properties and Mechanism of PEALD-In(2)O(3) Thin Films Prepared by Different Precursor Reaction Energy
por: Zhao, Ming-Jie, et al.
Publicado: (2021) -
Resistive Switching Characteristics of HfO(2) Thin Films on Mica Substrates Prepared by Sol-Gel Process
por: Liu, Chao-Feng, et al.
Publicado: (2019) -
Surface Passivation of Silicon Using HfO(2) Thin Films Deposited by Remote Plasma Atomic Layer Deposition System
por: Zhang, Xiao-Ying, et al.
Publicado: (2017) -
Effect of Ag Concentration Dispersed in HfO(x) Thin Films on Threshold Switching
por: Jeong, Won Hee, et al.
Publicado: (2020) -
PEALD-Grown Crystalline AlN Films on Si (100) with Sharp Interface and Good Uniformity
por: Liu, Sanjie, et al.
Publicado: (2017)