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Root Electrical Capacitance Can Be a Promising Plant Phenotyping Parameter in Wheat
As root electrical capacitance (C(R)*) was assumed to depend on the stem properties, the efficiency of measuring C(R)* at flowering for whole-plant phenotyping was assessed in five wheat cultivars in three replicate plots over two years. Linear regression analysis was used to correlate C(R)* with pl...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2022
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9657365/ https://www.ncbi.nlm.nih.gov/pubmed/36365428 http://dx.doi.org/10.3390/plants11212975 |