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X-ray Diffuse Scattering from Ca(3)NbGa(3)Si(2)O(14) Single Crystal under External Electric Field Application
X-ray diffuse scattering from the Ca(3)NbGa(3)Si(2)O(14) (CNGS) crystal was measured with a triple axis X-ray diffractometer under the conditions of an external electric field. It is found that the nature of the intensity distribution of the asymmetrical part of diffuse scattering depends on the val...
Autores principales: | , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9657851/ https://www.ncbi.nlm.nih.gov/pubmed/36363282 http://dx.doi.org/10.3390/ma15217692 |
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author | Irzhak, Dmitrii Roshchupkin, Dmitry |
author_facet | Irzhak, Dmitrii Roshchupkin, Dmitry |
author_sort | Irzhak, Dmitrii |
collection | PubMed |
description | X-ray diffuse scattering from the Ca(3)NbGa(3)Si(2)O(14) (CNGS) crystal was measured with a triple axis X-ray diffractometer under the conditions of an external electric field. It is found that the nature of the intensity distribution of the asymmetrical part of diffuse scattering depends on the value of the applied electric field. This phenomenon is apparently associated with different piezoelectric characteristics of defect regions and the rest of the single crystal. |
format | Online Article Text |
id | pubmed-9657851 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2022 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-96578512022-11-15 X-ray Diffuse Scattering from Ca(3)NbGa(3)Si(2)O(14) Single Crystal under External Electric Field Application Irzhak, Dmitrii Roshchupkin, Dmitry Materials (Basel) Article X-ray diffuse scattering from the Ca(3)NbGa(3)Si(2)O(14) (CNGS) crystal was measured with a triple axis X-ray diffractometer under the conditions of an external electric field. It is found that the nature of the intensity distribution of the asymmetrical part of diffuse scattering depends on the value of the applied electric field. This phenomenon is apparently associated with different piezoelectric characteristics of defect regions and the rest of the single crystal. MDPI 2022-11-01 /pmc/articles/PMC9657851/ /pubmed/36363282 http://dx.doi.org/10.3390/ma15217692 Text en © 2022 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Irzhak, Dmitrii Roshchupkin, Dmitry X-ray Diffuse Scattering from Ca(3)NbGa(3)Si(2)O(14) Single Crystal under External Electric Field Application |
title | X-ray Diffuse Scattering from Ca(3)NbGa(3)Si(2)O(14) Single Crystal under External Electric Field Application |
title_full | X-ray Diffuse Scattering from Ca(3)NbGa(3)Si(2)O(14) Single Crystal under External Electric Field Application |
title_fullStr | X-ray Diffuse Scattering from Ca(3)NbGa(3)Si(2)O(14) Single Crystal under External Electric Field Application |
title_full_unstemmed | X-ray Diffuse Scattering from Ca(3)NbGa(3)Si(2)O(14) Single Crystal under External Electric Field Application |
title_short | X-ray Diffuse Scattering from Ca(3)NbGa(3)Si(2)O(14) Single Crystal under External Electric Field Application |
title_sort | x-ray diffuse scattering from ca(3)nbga(3)si(2)o(14) single crystal under external electric field application |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9657851/ https://www.ncbi.nlm.nih.gov/pubmed/36363282 http://dx.doi.org/10.3390/ma15217692 |
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