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Scan-Free GEXRF in the Soft X-ray Range for the Investigation of Structured Nanosamples
Scan-free grazing-emission X-ray fluorescence spectroscopy (GEXRF) is an established technique for the investigation of the elemental depth-profiles of various samples. Recently it has been applied to investigating structured nanosamples in the tender X-ray range. However, lighter elements such as o...
Autores principales: | , , , , , , , , , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9658930/ https://www.ncbi.nlm.nih.gov/pubmed/36364540 http://dx.doi.org/10.3390/nano12213766 |
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author | Staeck, Steffen Andrle, Anna Hönicke, Philipp Baumann, Jonas Grötzsch, Daniel Weser, Jan Goetzke, Gesa Jonas, Adrian Kayser, Yves Förste, Frank Mantouvalou, Ioanna Viefhaus, Jens Soltwisch, Victor Stiel, Holger Beckhoff, Burkhard Kanngießer, Birgit |
author_facet | Staeck, Steffen Andrle, Anna Hönicke, Philipp Baumann, Jonas Grötzsch, Daniel Weser, Jan Goetzke, Gesa Jonas, Adrian Kayser, Yves Förste, Frank Mantouvalou, Ioanna Viefhaus, Jens Soltwisch, Victor Stiel, Holger Beckhoff, Burkhard Kanngießer, Birgit |
author_sort | Staeck, Steffen |
collection | PubMed |
description | Scan-free grazing-emission X-ray fluorescence spectroscopy (GEXRF) is an established technique for the investigation of the elemental depth-profiles of various samples. Recently it has been applied to investigating structured nanosamples in the tender X-ray range. However, lighter elements such as oxygen, nitrogen or carbon cannot be efficiently investigated in this energy range, because of the ineffective excitation. Moreover, common CCD detectors are not able to discriminate between fluorescence lines below 1 keV. Oxygen and nitrogen are important components of insulation and passivation layers, for example, in silicon oxide or silicon nitride. In this work, scan-free GEXRF is applied in proof-of-concept measurements for the investigation of lateral ordered 2D nanostructures in the soft X-ray range. The sample investigated is a [Formula: see text] lamellar grating, which represents 2D periodic nanostructures as used in the semiconductor industry. The emerging two-dimensional fluorescence patterns are recorded with a CMOS detector. To this end, energy-dispersive spectra are obtained via single-photon event evaluation. In this way, spatial and therefore angular information is obtained, while discrimination between different photon energies is enabled. The results are compared to calculations of the sample model performed by a Maxwell solver based on the finite-elements method. A first measurement is carried out at the UE56-2 PGM-2 beamline at the BESSY II synchrotron radiation facility to demonstrate the feasibility of the method in the soft X-ray range. Furthermore, a laser-produced plasma source (LPP) is utilized to investigate the feasibility of this technique in the laboratory. The results from the BESSY II measurements are in good agreement with the simulations and prove the applicability of scan-free GEXRF in the soft X-ray range for quality control and process engineering of 2D nanostructures. The LPP results illustrate the chances and challenges concerning a transfer of the methodology to the laboratory. |
format | Online Article Text |
id | pubmed-9658930 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2022 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-96589302022-11-15 Scan-Free GEXRF in the Soft X-ray Range for the Investigation of Structured Nanosamples Staeck, Steffen Andrle, Anna Hönicke, Philipp Baumann, Jonas Grötzsch, Daniel Weser, Jan Goetzke, Gesa Jonas, Adrian Kayser, Yves Förste, Frank Mantouvalou, Ioanna Viefhaus, Jens Soltwisch, Victor Stiel, Holger Beckhoff, Burkhard Kanngießer, Birgit Nanomaterials (Basel) Article Scan-free grazing-emission X-ray fluorescence spectroscopy (GEXRF) is an established technique for the investigation of the elemental depth-profiles of various samples. Recently it has been applied to investigating structured nanosamples in the tender X-ray range. However, lighter elements such as oxygen, nitrogen or carbon cannot be efficiently investigated in this energy range, because of the ineffective excitation. Moreover, common CCD detectors are not able to discriminate between fluorescence lines below 1 keV. Oxygen and nitrogen are important components of insulation and passivation layers, for example, in silicon oxide or silicon nitride. In this work, scan-free GEXRF is applied in proof-of-concept measurements for the investigation of lateral ordered 2D nanostructures in the soft X-ray range. The sample investigated is a [Formula: see text] lamellar grating, which represents 2D periodic nanostructures as used in the semiconductor industry. The emerging two-dimensional fluorescence patterns are recorded with a CMOS detector. To this end, energy-dispersive spectra are obtained via single-photon event evaluation. In this way, spatial and therefore angular information is obtained, while discrimination between different photon energies is enabled. The results are compared to calculations of the sample model performed by a Maxwell solver based on the finite-elements method. A first measurement is carried out at the UE56-2 PGM-2 beamline at the BESSY II synchrotron radiation facility to demonstrate the feasibility of the method in the soft X-ray range. Furthermore, a laser-produced plasma source (LPP) is utilized to investigate the feasibility of this technique in the laboratory. The results from the BESSY II measurements are in good agreement with the simulations and prove the applicability of scan-free GEXRF in the soft X-ray range for quality control and process engineering of 2D nanostructures. The LPP results illustrate the chances and challenges concerning a transfer of the methodology to the laboratory. MDPI 2022-10-26 /pmc/articles/PMC9658930/ /pubmed/36364540 http://dx.doi.org/10.3390/nano12213766 Text en © 2022 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Staeck, Steffen Andrle, Anna Hönicke, Philipp Baumann, Jonas Grötzsch, Daniel Weser, Jan Goetzke, Gesa Jonas, Adrian Kayser, Yves Förste, Frank Mantouvalou, Ioanna Viefhaus, Jens Soltwisch, Victor Stiel, Holger Beckhoff, Burkhard Kanngießer, Birgit Scan-Free GEXRF in the Soft X-ray Range for the Investigation of Structured Nanosamples |
title | Scan-Free GEXRF in the Soft X-ray Range for the Investigation of Structured Nanosamples |
title_full | Scan-Free GEXRF in the Soft X-ray Range for the Investigation of Structured Nanosamples |
title_fullStr | Scan-Free GEXRF in the Soft X-ray Range for the Investigation of Structured Nanosamples |
title_full_unstemmed | Scan-Free GEXRF in the Soft X-ray Range for the Investigation of Structured Nanosamples |
title_short | Scan-Free GEXRF in the Soft X-ray Range for the Investigation of Structured Nanosamples |
title_sort | scan-free gexrf in the soft x-ray range for the investigation of structured nanosamples |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9658930/ https://www.ncbi.nlm.nih.gov/pubmed/36364540 http://dx.doi.org/10.3390/nano12213766 |
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