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Scan-Free GEXRF in the Soft X-ray Range for the Investigation of Structured Nanosamples

Scan-free grazing-emission X-ray fluorescence spectroscopy (GEXRF) is an established technique for the investigation of the elemental depth-profiles of various samples. Recently it has been applied to investigating structured nanosamples in the tender X-ray range. However, lighter elements such as o...

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Autores principales: Staeck, Steffen, Andrle, Anna, Hönicke, Philipp, Baumann, Jonas, Grötzsch, Daniel, Weser, Jan, Goetzke, Gesa, Jonas, Adrian, Kayser, Yves, Förste, Frank, Mantouvalou, Ioanna, Viefhaus, Jens, Soltwisch, Victor, Stiel, Holger, Beckhoff, Burkhard, Kanngießer, Birgit
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9658930/
https://www.ncbi.nlm.nih.gov/pubmed/36364540
http://dx.doi.org/10.3390/nano12213766
_version_ 1784830075548467200
author Staeck, Steffen
Andrle, Anna
Hönicke, Philipp
Baumann, Jonas
Grötzsch, Daniel
Weser, Jan
Goetzke, Gesa
Jonas, Adrian
Kayser, Yves
Förste, Frank
Mantouvalou, Ioanna
Viefhaus, Jens
Soltwisch, Victor
Stiel, Holger
Beckhoff, Burkhard
Kanngießer, Birgit
author_facet Staeck, Steffen
Andrle, Anna
Hönicke, Philipp
Baumann, Jonas
Grötzsch, Daniel
Weser, Jan
Goetzke, Gesa
Jonas, Adrian
Kayser, Yves
Förste, Frank
Mantouvalou, Ioanna
Viefhaus, Jens
Soltwisch, Victor
Stiel, Holger
Beckhoff, Burkhard
Kanngießer, Birgit
author_sort Staeck, Steffen
collection PubMed
description Scan-free grazing-emission X-ray fluorescence spectroscopy (GEXRF) is an established technique for the investigation of the elemental depth-profiles of various samples. Recently it has been applied to investigating structured nanosamples in the tender X-ray range. However, lighter elements such as oxygen, nitrogen or carbon cannot be efficiently investigated in this energy range, because of the ineffective excitation. Moreover, common CCD detectors are not able to discriminate between fluorescence lines below 1 keV. Oxygen and nitrogen are important components of insulation and passivation layers, for example, in silicon oxide or silicon nitride. In this work, scan-free GEXRF is applied in proof-of-concept measurements for the investigation of lateral ordered 2D nanostructures in the soft X-ray range. The sample investigated is a [Formula: see text] lamellar grating, which represents 2D periodic nanostructures as used in the semiconductor industry. The emerging two-dimensional fluorescence patterns are recorded with a CMOS detector. To this end, energy-dispersive spectra are obtained via single-photon event evaluation. In this way, spatial and therefore angular information is obtained, while discrimination between different photon energies is enabled. The results are compared to calculations of the sample model performed by a Maxwell solver based on the finite-elements method. A first measurement is carried out at the UE56-2 PGM-2 beamline at the BESSY II synchrotron radiation facility to demonstrate the feasibility of the method in the soft X-ray range. Furthermore, a laser-produced plasma source (LPP) is utilized to investigate the feasibility of this technique in the laboratory. The results from the BESSY II measurements are in good agreement with the simulations and prove the applicability of scan-free GEXRF in the soft X-ray range for quality control and process engineering of 2D nanostructures. The LPP results illustrate the chances and challenges concerning a transfer of the methodology to the laboratory.
format Online
Article
Text
id pubmed-9658930
institution National Center for Biotechnology Information
language English
publishDate 2022
publisher MDPI
record_format MEDLINE/PubMed
spelling pubmed-96589302022-11-15 Scan-Free GEXRF in the Soft X-ray Range for the Investigation of Structured Nanosamples Staeck, Steffen Andrle, Anna Hönicke, Philipp Baumann, Jonas Grötzsch, Daniel Weser, Jan Goetzke, Gesa Jonas, Adrian Kayser, Yves Förste, Frank Mantouvalou, Ioanna Viefhaus, Jens Soltwisch, Victor Stiel, Holger Beckhoff, Burkhard Kanngießer, Birgit Nanomaterials (Basel) Article Scan-free grazing-emission X-ray fluorescence spectroscopy (GEXRF) is an established technique for the investigation of the elemental depth-profiles of various samples. Recently it has been applied to investigating structured nanosamples in the tender X-ray range. However, lighter elements such as oxygen, nitrogen or carbon cannot be efficiently investigated in this energy range, because of the ineffective excitation. Moreover, common CCD detectors are not able to discriminate between fluorescence lines below 1 keV. Oxygen and nitrogen are important components of insulation and passivation layers, for example, in silicon oxide or silicon nitride. In this work, scan-free GEXRF is applied in proof-of-concept measurements for the investigation of lateral ordered 2D nanostructures in the soft X-ray range. The sample investigated is a [Formula: see text] lamellar grating, which represents 2D periodic nanostructures as used in the semiconductor industry. The emerging two-dimensional fluorescence patterns are recorded with a CMOS detector. To this end, energy-dispersive spectra are obtained via single-photon event evaluation. In this way, spatial and therefore angular information is obtained, while discrimination between different photon energies is enabled. The results are compared to calculations of the sample model performed by a Maxwell solver based on the finite-elements method. A first measurement is carried out at the UE56-2 PGM-2 beamline at the BESSY II synchrotron radiation facility to demonstrate the feasibility of the method in the soft X-ray range. Furthermore, a laser-produced plasma source (LPP) is utilized to investigate the feasibility of this technique in the laboratory. The results from the BESSY II measurements are in good agreement with the simulations and prove the applicability of scan-free GEXRF in the soft X-ray range for quality control and process engineering of 2D nanostructures. The LPP results illustrate the chances and challenges concerning a transfer of the methodology to the laboratory. MDPI 2022-10-26 /pmc/articles/PMC9658930/ /pubmed/36364540 http://dx.doi.org/10.3390/nano12213766 Text en © 2022 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Staeck, Steffen
Andrle, Anna
Hönicke, Philipp
Baumann, Jonas
Grötzsch, Daniel
Weser, Jan
Goetzke, Gesa
Jonas, Adrian
Kayser, Yves
Förste, Frank
Mantouvalou, Ioanna
Viefhaus, Jens
Soltwisch, Victor
Stiel, Holger
Beckhoff, Burkhard
Kanngießer, Birgit
Scan-Free GEXRF in the Soft X-ray Range for the Investigation of Structured Nanosamples
title Scan-Free GEXRF in the Soft X-ray Range for the Investigation of Structured Nanosamples
title_full Scan-Free GEXRF in the Soft X-ray Range for the Investigation of Structured Nanosamples
title_fullStr Scan-Free GEXRF in the Soft X-ray Range for the Investigation of Structured Nanosamples
title_full_unstemmed Scan-Free GEXRF in the Soft X-ray Range for the Investigation of Structured Nanosamples
title_short Scan-Free GEXRF in the Soft X-ray Range for the Investigation of Structured Nanosamples
title_sort scan-free gexrf in the soft x-ray range for the investigation of structured nanosamples
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9658930/
https://www.ncbi.nlm.nih.gov/pubmed/36364540
http://dx.doi.org/10.3390/nano12213766
work_keys_str_mv AT staecksteffen scanfreegexrfinthesoftxrayrangefortheinvestigationofstructurednanosamples
AT andrleanna scanfreegexrfinthesoftxrayrangefortheinvestigationofstructurednanosamples
AT honickephilipp scanfreegexrfinthesoftxrayrangefortheinvestigationofstructurednanosamples
AT baumannjonas scanfreegexrfinthesoftxrayrangefortheinvestigationofstructurednanosamples
AT grotzschdaniel scanfreegexrfinthesoftxrayrangefortheinvestigationofstructurednanosamples
AT weserjan scanfreegexrfinthesoftxrayrangefortheinvestigationofstructurednanosamples
AT goetzkegesa scanfreegexrfinthesoftxrayrangefortheinvestigationofstructurednanosamples
AT jonasadrian scanfreegexrfinthesoftxrayrangefortheinvestigationofstructurednanosamples
AT kayseryves scanfreegexrfinthesoftxrayrangefortheinvestigationofstructurednanosamples
AT forstefrank scanfreegexrfinthesoftxrayrangefortheinvestigationofstructurednanosamples
AT mantouvalouioanna scanfreegexrfinthesoftxrayrangefortheinvestigationofstructurednanosamples
AT viefhausjens scanfreegexrfinthesoftxrayrangefortheinvestigationofstructurednanosamples
AT soltwischvictor scanfreegexrfinthesoftxrayrangefortheinvestigationofstructurednanosamples
AT stielholger scanfreegexrfinthesoftxrayrangefortheinvestigationofstructurednanosamples
AT beckhoffburkhard scanfreegexrfinthesoftxrayrangefortheinvestigationofstructurednanosamples
AT kanngießerbirgit scanfreegexrfinthesoftxrayrangefortheinvestigationofstructurednanosamples