Scan-Free GEXRF in the Soft X-ray Range for the Investigation of Structured Nanosamples

Scan-free grazing-emission X-ray fluorescence spectroscopy (GEXRF) is an established technique for the investigation of the elemental depth-profiles of various samples. Recently it has been applied to investigating structured nanosamples in the tender X-ray range. However, lighter elements such as o...

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Detalles Bibliográficos
Autores principales: Staeck, Steffen, Andrle, Anna, Hönicke, Philipp, Baumann, Jonas, Grötzsch, Daniel, Weser, Jan, Goetzke, Gesa, Jonas, Adrian, Kayser, Yves, Förste, Frank, Mantouvalou, Ioanna, Viefhaus, Jens, Soltwisch, Victor, Stiel, Holger, Beckhoff, Burkhard, Kanngießer, Birgit
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9658930/
https://www.ncbi.nlm.nih.gov/pubmed/36364540
http://dx.doi.org/10.3390/nano12213766

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9658930/
https://www.ncbi.nlm.nih.gov/pubmed/36364540
http://dx.doi.org/10.3390/nano12213766

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