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Atomistic measurement and modeling of intrinsic fracture toughness of two-dimensional materials
Quantifying the intrinsic mechanical properties of two-dimensional (2D) materials is essential to predict the long-term reliability of materials and systems in emerging applications ranging from energy to health to next-generation sensors and electronics. Currently, measurements of fracture toughnes...
Autores principales: | , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
National Academy of Sciences
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9659395/ https://www.ncbi.nlm.nih.gov/pubmed/36331995 http://dx.doi.org/10.1073/pnas.2206756119 |
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author | Zhang, Xu Nguyen, Hoang Zhang, Xiang Ajayan, Pulickel M. Wen, Jianguo Espinosa, Horacio D. |
author_facet | Zhang, Xu Nguyen, Hoang Zhang, Xiang Ajayan, Pulickel M. Wen, Jianguo Espinosa, Horacio D. |
author_sort | Zhang, Xu |
collection | PubMed |
description | Quantifying the intrinsic mechanical properties of two-dimensional (2D) materials is essential to predict the long-term reliability of materials and systems in emerging applications ranging from energy to health to next-generation sensors and electronics. Currently, measurements of fracture toughness and identification of associated atomistic mechanisms remain challenging. Herein, we report an integrated experimental–computational framework in which in-situ high-resolution transmission electron microscopy (HRTEM) measurements of the intrinsic fracture energy of monolayer MoS(2) and MoSe(2) are in good agreement with atomistic model predictions based on an accurately parameterized interatomic potential. Changes in crystalline structures at the crack tip and crack edges, as observed in in-situ HRTEM crack extension tests, are properly predicted. Such a good agreement is the result of including large deformation pathways and phase transitions in the parameterization of the inter-atomic potential. The established framework emerges as a robust approach to determine the predictive capabilities of molecular dynamics models employed in the screening of 2D materials, in the spirit of the materials genome initiative. Moreover, it enables device-level predictions with superior accuracy (e.g., fatigue lifetime predictions of electro- and opto-electronic nanodevices). |
format | Online Article Text |
id | pubmed-9659395 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2022 |
publisher | National Academy of Sciences |
record_format | MEDLINE/PubMed |
spelling | pubmed-96593952023-05-04 Atomistic measurement and modeling of intrinsic fracture toughness of two-dimensional materials Zhang, Xu Nguyen, Hoang Zhang, Xiang Ajayan, Pulickel M. Wen, Jianguo Espinosa, Horacio D. Proc Natl Acad Sci U S A Physical Sciences Quantifying the intrinsic mechanical properties of two-dimensional (2D) materials is essential to predict the long-term reliability of materials and systems in emerging applications ranging from energy to health to next-generation sensors and electronics. Currently, measurements of fracture toughness and identification of associated atomistic mechanisms remain challenging. Herein, we report an integrated experimental–computational framework in which in-situ high-resolution transmission electron microscopy (HRTEM) measurements of the intrinsic fracture energy of monolayer MoS(2) and MoSe(2) are in good agreement with atomistic model predictions based on an accurately parameterized interatomic potential. Changes in crystalline structures at the crack tip and crack edges, as observed in in-situ HRTEM crack extension tests, are properly predicted. Such a good agreement is the result of including large deformation pathways and phase transitions in the parameterization of the inter-atomic potential. The established framework emerges as a robust approach to determine the predictive capabilities of molecular dynamics models employed in the screening of 2D materials, in the spirit of the materials genome initiative. Moreover, it enables device-level predictions with superior accuracy (e.g., fatigue lifetime predictions of electro- and opto-electronic nanodevices). National Academy of Sciences 2022-11-04 2022-11-08 /pmc/articles/PMC9659395/ /pubmed/36331995 http://dx.doi.org/10.1073/pnas.2206756119 Text en Copyright © 2022 the Author(s). Published by PNAS. https://creativecommons.org/licenses/by-nc-nd/4.0/This article is distributed under Creative Commons Attribution-NonCommercial-NoDerivatives License 4.0 (CC BY-NC-ND) (https://creativecommons.org/licenses/by-nc-nd/4.0/) . |
spellingShingle | Physical Sciences Zhang, Xu Nguyen, Hoang Zhang, Xiang Ajayan, Pulickel M. Wen, Jianguo Espinosa, Horacio D. Atomistic measurement and modeling of intrinsic fracture toughness of two-dimensional materials |
title | Atomistic measurement and modeling of intrinsic fracture toughness of two-dimensional materials |
title_full | Atomistic measurement and modeling of intrinsic fracture toughness of two-dimensional materials |
title_fullStr | Atomistic measurement and modeling of intrinsic fracture toughness of two-dimensional materials |
title_full_unstemmed | Atomistic measurement and modeling of intrinsic fracture toughness of two-dimensional materials |
title_short | Atomistic measurement and modeling of intrinsic fracture toughness of two-dimensional materials |
title_sort | atomistic measurement and modeling of intrinsic fracture toughness of two-dimensional materials |
topic | Physical Sciences |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9659395/ https://www.ncbi.nlm.nih.gov/pubmed/36331995 http://dx.doi.org/10.1073/pnas.2206756119 |
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