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Formation of Highly Efficient Perovskite Solar Cells by Applying Li-Doped CuSCN Hole Conductor and Interface Treatment

Li-doped CuSCN films of various compositions were applied as hole-transporting material (HTM) for mesoscopic perovskite solar cells (PSCs). Those films of ~60 nm thickness, spin-coated on the perovskite layer, exhibit significantly higher crystallinity and hole mobility compared with the pristine Cu...

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Detalles Bibliográficos
Autores principales: Yang, In Seok, Park, You Jin, Hwang, Yujin, Yang, Hoi Chang, Kim, Jeongho, Lee, Wan In
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9698157/
https://www.ncbi.nlm.nih.gov/pubmed/36432255
http://dx.doi.org/10.3390/nano12223969
Descripción
Sumario:Li-doped CuSCN films of various compositions were applied as hole-transporting material (HTM) for mesoscopic perovskite solar cells (PSCs). Those films of ~60 nm thickness, spin-coated on the perovskite layer, exhibit significantly higher crystallinity and hole mobility compared with the pristine CuSCN films. Among them, 0.33% Li-doped CuSCN (Li0.33:CuSCN) shows the best performance as the HTM of mesoscopic PSC. Furthermore, by depositing a slight amount of PCPDTBT over the Li0.33:CuSCN layer, the V(OC) was increased to 1.075 V, resulting in an average PCE of 20.24% and 20.65% for the champion device. These PCE and V(OC) values are comparable to those of PSC using spiro-OMETAD (PCE: 20.61%, V(OC): 1.089 V). Such a remarkable increase can be attributed to the penetration of the PCPDTBT polymer into the grain boundaries of the Li0.33:CuSCN film, and to the interface with the perovskite layer, leading to the removal of defects on the perovskite surface by paving the non-contacting parts, as well as to the tight interconnection of the Li0.33:CuSCN grains. The PSC device with Li0.33:CuSCN showed a high long-term stability similar to that with bare CuSCN, and the introduction of PCPDTBT onto the perovskite/Li0.33:CuSCN further improved device stability, exhibiting 94% of the initial PCE after 100 days.