Cargando…
Mechanical Characterization of Two-Segment Free-Standing ZnO Nanowires Using Lateral Force Microscopy
Mechanical characterization of quasi one-dimensional nanostructures is essential for the design of novel nanoelectromechanical systems. However, the results obtained on basic mechanical quantities, such as Young’s modulus and fracture strength, show significant standard deviation in the literature....
Autores principales: | , , , |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2022
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9737293/ https://www.ncbi.nlm.nih.gov/pubmed/36500742 http://dx.doi.org/10.3390/nano12234120 |
_version_ | 1784847249982881792 |
---|---|
author | Volk, János Radó, János Baji, Zsófia Erdélyi, Róbert |
author_facet | Volk, János Radó, János Baji, Zsófia Erdélyi, Róbert |
author_sort | Volk, János |
collection | PubMed |
description | Mechanical characterization of quasi one-dimensional nanostructures is essential for the design of novel nanoelectromechanical systems. However, the results obtained on basic mechanical quantities, such as Young’s modulus and fracture strength, show significant standard deviation in the literature. This is partly because of diversity in the quality of the nanowire, and partly because of inappropriately performed mechanical tests and simplified mechanical models. Here we present orientation-controlled bending and fracture studies on wet chemically grown vertical ZnO nanowires, using lateral force microscopy. The lateral force signal of the atomic force microscope was calibrated by a diamagnetic levitation spring system. By acquiring the bending curves of 14 nanowires, and applying a two-segment mechanical model, an average bending modulus of 108 ± 17 GPa was obtained, which was 23% lower than the Young’s modulus of bulk ZnO in the [0001] direction. It was also found that the average fracture strain and stress inside the nanowire was above 3.1 ± 0.3 % and 3.3 ± 0.3 GPa, respectively. However, the fracture of the nanowires was governed by the quality of the nanowire/substrate interface. The demonstrated technique is a relatively simple and productive way for the accurate mechanical characterization of vertical nanowire arrays. |
format | Online Article Text |
id | pubmed-9737293 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2022 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-97372932022-12-11 Mechanical Characterization of Two-Segment Free-Standing ZnO Nanowires Using Lateral Force Microscopy Volk, János Radó, János Baji, Zsófia Erdélyi, Róbert Nanomaterials (Basel) Article Mechanical characterization of quasi one-dimensional nanostructures is essential for the design of novel nanoelectromechanical systems. However, the results obtained on basic mechanical quantities, such as Young’s modulus and fracture strength, show significant standard deviation in the literature. This is partly because of diversity in the quality of the nanowire, and partly because of inappropriately performed mechanical tests and simplified mechanical models. Here we present orientation-controlled bending and fracture studies on wet chemically grown vertical ZnO nanowires, using lateral force microscopy. The lateral force signal of the atomic force microscope was calibrated by a diamagnetic levitation spring system. By acquiring the bending curves of 14 nanowires, and applying a two-segment mechanical model, an average bending modulus of 108 ± 17 GPa was obtained, which was 23% lower than the Young’s modulus of bulk ZnO in the [0001] direction. It was also found that the average fracture strain and stress inside the nanowire was above 3.1 ± 0.3 % and 3.3 ± 0.3 GPa, respectively. However, the fracture of the nanowires was governed by the quality of the nanowire/substrate interface. The demonstrated technique is a relatively simple and productive way for the accurate mechanical characterization of vertical nanowire arrays. MDPI 2022-11-22 /pmc/articles/PMC9737293/ /pubmed/36500742 http://dx.doi.org/10.3390/nano12234120 Text en © 2022 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Volk, János Radó, János Baji, Zsófia Erdélyi, Róbert Mechanical Characterization of Two-Segment Free-Standing ZnO Nanowires Using Lateral Force Microscopy |
title | Mechanical Characterization of Two-Segment Free-Standing ZnO Nanowires Using Lateral Force Microscopy |
title_full | Mechanical Characterization of Two-Segment Free-Standing ZnO Nanowires Using Lateral Force Microscopy |
title_fullStr | Mechanical Characterization of Two-Segment Free-Standing ZnO Nanowires Using Lateral Force Microscopy |
title_full_unstemmed | Mechanical Characterization of Two-Segment Free-Standing ZnO Nanowires Using Lateral Force Microscopy |
title_short | Mechanical Characterization of Two-Segment Free-Standing ZnO Nanowires Using Lateral Force Microscopy |
title_sort | mechanical characterization of two-segment free-standing zno nanowires using lateral force microscopy |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9737293/ https://www.ncbi.nlm.nih.gov/pubmed/36500742 http://dx.doi.org/10.3390/nano12234120 |
work_keys_str_mv | AT volkjanos mechanicalcharacterizationoftwosegmentfreestandingznonanowiresusinglateralforcemicroscopy AT radojanos mechanicalcharacterizationoftwosegmentfreestandingznonanowiresusinglateralforcemicroscopy AT bajizsofia mechanicalcharacterizationoftwosegmentfreestandingznonanowiresusinglateralforcemicroscopy AT erdelyirobert mechanicalcharacterizationoftwosegmentfreestandingznonanowiresusinglateralforcemicroscopy |