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Mechanical Characterization of Two-Segment Free-Standing ZnO Nanowires Using Lateral Force Microscopy

Mechanical characterization of quasi one-dimensional nanostructures is essential for the design of novel nanoelectromechanical systems. However, the results obtained on basic mechanical quantities, such as Young’s modulus and fracture strength, show significant standard deviation in the literature....

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Autores principales: Volk, János, Radó, János, Baji, Zsófia, Erdélyi, Róbert
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9737293/
https://www.ncbi.nlm.nih.gov/pubmed/36500742
http://dx.doi.org/10.3390/nano12234120
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author Volk, János
Radó, János
Baji, Zsófia
Erdélyi, Róbert
author_facet Volk, János
Radó, János
Baji, Zsófia
Erdélyi, Róbert
author_sort Volk, János
collection PubMed
description Mechanical characterization of quasi one-dimensional nanostructures is essential for the design of novel nanoelectromechanical systems. However, the results obtained on basic mechanical quantities, such as Young’s modulus and fracture strength, show significant standard deviation in the literature. This is partly because of diversity in the quality of the nanowire, and partly because of inappropriately performed mechanical tests and simplified mechanical models. Here we present orientation-controlled bending and fracture studies on wet chemically grown vertical ZnO nanowires, using lateral force microscopy. The lateral force signal of the atomic force microscope was calibrated by a diamagnetic levitation spring system. By acquiring the bending curves of 14 nanowires, and applying a two-segment mechanical model, an average bending modulus of 108 ± 17 GPa was obtained, which was 23% lower than the Young’s modulus of bulk ZnO in the [0001] direction. It was also found that the average fracture strain and stress inside the nanowire was above 3.1 ± 0.3 % and 3.3 ± 0.3 GPa, respectively. However, the fracture of the nanowires was governed by the quality of the nanowire/substrate interface. The demonstrated technique is a relatively simple and productive way for the accurate mechanical characterization of vertical nanowire arrays.
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spelling pubmed-97372932022-12-11 Mechanical Characterization of Two-Segment Free-Standing ZnO Nanowires Using Lateral Force Microscopy Volk, János Radó, János Baji, Zsófia Erdélyi, Róbert Nanomaterials (Basel) Article Mechanical characterization of quasi one-dimensional nanostructures is essential for the design of novel nanoelectromechanical systems. However, the results obtained on basic mechanical quantities, such as Young’s modulus and fracture strength, show significant standard deviation in the literature. This is partly because of diversity in the quality of the nanowire, and partly because of inappropriately performed mechanical tests and simplified mechanical models. Here we present orientation-controlled bending and fracture studies on wet chemically grown vertical ZnO nanowires, using lateral force microscopy. The lateral force signal of the atomic force microscope was calibrated by a diamagnetic levitation spring system. By acquiring the bending curves of 14 nanowires, and applying a two-segment mechanical model, an average bending modulus of 108 ± 17 GPa was obtained, which was 23% lower than the Young’s modulus of bulk ZnO in the [0001] direction. It was also found that the average fracture strain and stress inside the nanowire was above 3.1 ± 0.3 % and 3.3 ± 0.3 GPa, respectively. However, the fracture of the nanowires was governed by the quality of the nanowire/substrate interface. The demonstrated technique is a relatively simple and productive way for the accurate mechanical characterization of vertical nanowire arrays. MDPI 2022-11-22 /pmc/articles/PMC9737293/ /pubmed/36500742 http://dx.doi.org/10.3390/nano12234120 Text en © 2022 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Volk, János
Radó, János
Baji, Zsófia
Erdélyi, Róbert
Mechanical Characterization of Two-Segment Free-Standing ZnO Nanowires Using Lateral Force Microscopy
title Mechanical Characterization of Two-Segment Free-Standing ZnO Nanowires Using Lateral Force Microscopy
title_full Mechanical Characterization of Two-Segment Free-Standing ZnO Nanowires Using Lateral Force Microscopy
title_fullStr Mechanical Characterization of Two-Segment Free-Standing ZnO Nanowires Using Lateral Force Microscopy
title_full_unstemmed Mechanical Characterization of Two-Segment Free-Standing ZnO Nanowires Using Lateral Force Microscopy
title_short Mechanical Characterization of Two-Segment Free-Standing ZnO Nanowires Using Lateral Force Microscopy
title_sort mechanical characterization of two-segment free-standing zno nanowires using lateral force microscopy
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9737293/
https://www.ncbi.nlm.nih.gov/pubmed/36500742
http://dx.doi.org/10.3390/nano12234120
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