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Industrial Anomaly Detection with Skip Autoencoder and Deep Feature Extractor
Over recent years, with the advances in image recognition technology for deep learning, researchers have devoted continued efforts toward importing anomaly detection technology into the production line of automatic optical detection. Although unsupervised learning helps overcome the high costs assoc...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2022
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9737726/ https://www.ncbi.nlm.nih.gov/pubmed/36502029 http://dx.doi.org/10.3390/s22239327 |