Effect of Annealing and Thickness of Co(40)Fe(40)Yb(20) Thin Films on Various Physical Properties on a Glass Substrate

The aim of this work is to investigate the effect of annealing and thickness on various physical properties in Co(40)Fe(40)Yb(20) thin films. X-ray diffraction (XRD) was used to determine the amorphous structure of Co(40)Fe(40)Yb(20) films. The maximum surface energy of 40 nm thin films at 300 °C is...

Descripción completa

Detalles Bibliográficos
Autores principales: Liu, Wen-Jen, Chang, Yung-Huang, Chiang, Chia-Chin, Fern, Chi-Lon, Chen, Yuan-Tsung, Chen, Ying-Hsuan, Liao, Hao-Wen, Wu, Te-Ho, Lin, Shih-Hung, Lin, Ko-Wei, Chi, Po-Wei
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9740169/
https://www.ncbi.nlm.nih.gov/pubmed/36500008
http://dx.doi.org/10.3390/ma15238509

Ejemplares similares

Ejemplares similares