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Self-Test and Self-Calibration of Digital Closed-Loop Accelerometers
For accelerometers targeted in inertial navigation field, the DC bias error is the most destructive system error, affecting the final precision of long-term dead reckoning. This paper proposes a novel self-test and self-calibration technique for canceling out the DC bias error of the digital closed-...
Autores principales: | , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9784190/ https://www.ncbi.nlm.nih.gov/pubmed/36560299 http://dx.doi.org/10.3390/s22249933 |
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author | Sun, Zhiyuan Wang, Miao |
author_facet | Sun, Zhiyuan Wang, Miao |
author_sort | Sun, Zhiyuan |
collection | PubMed |
description | For accelerometers targeted in inertial navigation field, the DC bias error is the most destructive system error, affecting the final precision of long-term dead reckoning. This paper proposes a novel self-test and self-calibration technique for canceling out the DC bias error of the digital closed-loop accelerometers. The self-test of system DC bias is realized by injecting a 1-Bit Σ∆ modulated digital excitation and measuring the second-order harmonic distortion. As illustrated, the second-order harmonic distortion is related to the servo position deviation of the MEMS sensing element, which is one of the main causes of system DC bias error. The automatic capacitance compensation is carried out based on the amplitude and phase information of the detected second-order harmonic distortion, which can dynamically calibrate out the DC bias error. Test results show that there exists a near-linearity relationship between the system DC bias error and the second-order harmonic distortion, which is consistent with the proposed theoretical deduction. Based on the proposed method, the system DC bias error is effectively reduced from 150 to 4 mg, and unaffected by external acceleration bias. |
format | Online Article Text |
id | pubmed-9784190 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2022 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-97841902022-12-24 Self-Test and Self-Calibration of Digital Closed-Loop Accelerometers Sun, Zhiyuan Wang, Miao Sensors (Basel) Communication For accelerometers targeted in inertial navigation field, the DC bias error is the most destructive system error, affecting the final precision of long-term dead reckoning. This paper proposes a novel self-test and self-calibration technique for canceling out the DC bias error of the digital closed-loop accelerometers. The self-test of system DC bias is realized by injecting a 1-Bit Σ∆ modulated digital excitation and measuring the second-order harmonic distortion. As illustrated, the second-order harmonic distortion is related to the servo position deviation of the MEMS sensing element, which is one of the main causes of system DC bias error. The automatic capacitance compensation is carried out based on the amplitude and phase information of the detected second-order harmonic distortion, which can dynamically calibrate out the DC bias error. Test results show that there exists a near-linearity relationship between the system DC bias error and the second-order harmonic distortion, which is consistent with the proposed theoretical deduction. Based on the proposed method, the system DC bias error is effectively reduced from 150 to 4 mg, and unaffected by external acceleration bias. MDPI 2022-12-16 /pmc/articles/PMC9784190/ /pubmed/36560299 http://dx.doi.org/10.3390/s22249933 Text en © 2022 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Communication Sun, Zhiyuan Wang, Miao Self-Test and Self-Calibration of Digital Closed-Loop Accelerometers |
title | Self-Test and Self-Calibration of Digital Closed-Loop Accelerometers |
title_full | Self-Test and Self-Calibration of Digital Closed-Loop Accelerometers |
title_fullStr | Self-Test and Self-Calibration of Digital Closed-Loop Accelerometers |
title_full_unstemmed | Self-Test and Self-Calibration of Digital Closed-Loop Accelerometers |
title_short | Self-Test and Self-Calibration of Digital Closed-Loop Accelerometers |
title_sort | self-test and self-calibration of digital closed-loop accelerometers |
topic | Communication |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9784190/ https://www.ncbi.nlm.nih.gov/pubmed/36560299 http://dx.doi.org/10.3390/s22249933 |
work_keys_str_mv | AT sunzhiyuan selftestandselfcalibrationofdigitalclosedloopaccelerometers AT wangmiao selftestandselfcalibrationofdigitalclosedloopaccelerometers |