Cargando…

Self-Test and Self-Calibration of Digital Closed-Loop Accelerometers

For accelerometers targeted in inertial navigation field, the DC bias error is the most destructive system error, affecting the final precision of long-term dead reckoning. This paper proposes a novel self-test and self-calibration technique for canceling out the DC bias error of the digital closed-...

Descripción completa

Detalles Bibliográficos
Autores principales: Sun, Zhiyuan, Wang, Miao
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9784190/
https://www.ncbi.nlm.nih.gov/pubmed/36560299
http://dx.doi.org/10.3390/s22249933
_version_ 1784857751079354368
author Sun, Zhiyuan
Wang, Miao
author_facet Sun, Zhiyuan
Wang, Miao
author_sort Sun, Zhiyuan
collection PubMed
description For accelerometers targeted in inertial navigation field, the DC bias error is the most destructive system error, affecting the final precision of long-term dead reckoning. This paper proposes a novel self-test and self-calibration technique for canceling out the DC bias error of the digital closed-loop accelerometers. The self-test of system DC bias is realized by injecting a 1-Bit Σ∆ modulated digital excitation and measuring the second-order harmonic distortion. As illustrated, the second-order harmonic distortion is related to the servo position deviation of the MEMS sensing element, which is one of the main causes of system DC bias error. The automatic capacitance compensation is carried out based on the amplitude and phase information of the detected second-order harmonic distortion, which can dynamically calibrate out the DC bias error. Test results show that there exists a near-linearity relationship between the system DC bias error and the second-order harmonic distortion, which is consistent with the proposed theoretical deduction. Based on the proposed method, the system DC bias error is effectively reduced from 150 to 4 mg, and unaffected by external acceleration bias.
format Online
Article
Text
id pubmed-9784190
institution National Center for Biotechnology Information
language English
publishDate 2022
publisher MDPI
record_format MEDLINE/PubMed
spelling pubmed-97841902022-12-24 Self-Test and Self-Calibration of Digital Closed-Loop Accelerometers Sun, Zhiyuan Wang, Miao Sensors (Basel) Communication For accelerometers targeted in inertial navigation field, the DC bias error is the most destructive system error, affecting the final precision of long-term dead reckoning. This paper proposes a novel self-test and self-calibration technique for canceling out the DC bias error of the digital closed-loop accelerometers. The self-test of system DC bias is realized by injecting a 1-Bit Σ∆ modulated digital excitation and measuring the second-order harmonic distortion. As illustrated, the second-order harmonic distortion is related to the servo position deviation of the MEMS sensing element, which is one of the main causes of system DC bias error. The automatic capacitance compensation is carried out based on the amplitude and phase information of the detected second-order harmonic distortion, which can dynamically calibrate out the DC bias error. Test results show that there exists a near-linearity relationship between the system DC bias error and the second-order harmonic distortion, which is consistent with the proposed theoretical deduction. Based on the proposed method, the system DC bias error is effectively reduced from 150 to 4 mg, and unaffected by external acceleration bias. MDPI 2022-12-16 /pmc/articles/PMC9784190/ /pubmed/36560299 http://dx.doi.org/10.3390/s22249933 Text en © 2022 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Communication
Sun, Zhiyuan
Wang, Miao
Self-Test and Self-Calibration of Digital Closed-Loop Accelerometers
title Self-Test and Self-Calibration of Digital Closed-Loop Accelerometers
title_full Self-Test and Self-Calibration of Digital Closed-Loop Accelerometers
title_fullStr Self-Test and Self-Calibration of Digital Closed-Loop Accelerometers
title_full_unstemmed Self-Test and Self-Calibration of Digital Closed-Loop Accelerometers
title_short Self-Test and Self-Calibration of Digital Closed-Loop Accelerometers
title_sort self-test and self-calibration of digital closed-loop accelerometers
topic Communication
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9784190/
https://www.ncbi.nlm.nih.gov/pubmed/36560299
http://dx.doi.org/10.3390/s22249933
work_keys_str_mv AT sunzhiyuan selftestandselfcalibrationofdigitalclosedloopaccelerometers
AT wangmiao selftestandselfcalibrationofdigitalclosedloopaccelerometers