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Imaging grain boundaries in a two-dimensional polymer
Organic materials are highly sensitive to electron beam irradiation and thus easily damaged upon imaging by electron microscopy. Now, low-dose aberration-corrected high resolution transmission electron microscopy allows for less invasive near-atomic-scale imaging of a two-dimensional polymer.
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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Nature Publishing Group UK
2020
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9814603/ https://www.ncbi.nlm.nih.gov/pubmed/36703342 http://dx.doi.org/10.1038/s42004-020-00380-3 |
| Sumario: | Organic materials are highly sensitive to electron beam irradiation and thus easily damaged upon imaging by electron microscopy. Now, low-dose aberration-corrected high resolution transmission electron microscopy allows for less invasive near-atomic-scale imaging of a two-dimensional polymer. |
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