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The electric double layer effect and its strong suppression at Li(+) solid electrolyte/hydrogenated diamond interfaces

The electric double layer (EDL) effect at solid electrolyte/electrode interfaces has been a key topic in many energy and nanoelectronics applications (e.g., all-solid-state Li(+) batteries and memristors). However, its characterization remains difficult in comparison with liquid electrolytes. Herein...

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Autores principales: Tsuchiya, Takashi, Takayanagi, Makoto, Mitsuishi, Kazutaka, Imura, Masataka, Ueda, Shigenori, Koide, Yasuo, Higuchi, Tohru, Terabe, Kazuya
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2021
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9814946/
https://www.ncbi.nlm.nih.gov/pubmed/36697812
http://dx.doi.org/10.1038/s42004-021-00554-7
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author Tsuchiya, Takashi
Takayanagi, Makoto
Mitsuishi, Kazutaka
Imura, Masataka
Ueda, Shigenori
Koide, Yasuo
Higuchi, Tohru
Terabe, Kazuya
author_facet Tsuchiya, Takashi
Takayanagi, Makoto
Mitsuishi, Kazutaka
Imura, Masataka
Ueda, Shigenori
Koide, Yasuo
Higuchi, Tohru
Terabe, Kazuya
author_sort Tsuchiya, Takashi
collection PubMed
description The electric double layer (EDL) effect at solid electrolyte/electrode interfaces has been a key topic in many energy and nanoelectronics applications (e.g., all-solid-state Li(+) batteries and memristors). However, its characterization remains difficult in comparison with liquid electrolytes. Herein, we use a novel method to show that the EDL effect, and its suppression at solid electrolyte/electronic material interfaces, can be characterized on the basis of the electric conduction characteristics of hydrogenated diamond(H-diamond)-based EDL transistors (EDLTs). Whereas H-diamond-based EDLT with a Li-Si-Zr-O Li(+) solid electrolyte showed EDL-induced hole density modulation over a range of up to three orders of magnitude, EDLT with a Li-La-Ti-O (LLTO) Li(+) solid electrolyte showed negligible enhancement, which indicates strong suppression of the EDL effect. Such suppression is attributed to charge neutralization in the LLTO, which is due to variation in the valence state of the Ti ions present. The method described is useful for quantitatively evaluating the EDL effect in various solid electrolytes.
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spelling pubmed-98149462023-01-10 The electric double layer effect and its strong suppression at Li(+) solid electrolyte/hydrogenated diamond interfaces Tsuchiya, Takashi Takayanagi, Makoto Mitsuishi, Kazutaka Imura, Masataka Ueda, Shigenori Koide, Yasuo Higuchi, Tohru Terabe, Kazuya Commun Chem Article The electric double layer (EDL) effect at solid electrolyte/electrode interfaces has been a key topic in many energy and nanoelectronics applications (e.g., all-solid-state Li(+) batteries and memristors). However, its characterization remains difficult in comparison with liquid electrolytes. Herein, we use a novel method to show that the EDL effect, and its suppression at solid electrolyte/electronic material interfaces, can be characterized on the basis of the electric conduction characteristics of hydrogenated diamond(H-diamond)-based EDL transistors (EDLTs). Whereas H-diamond-based EDLT with a Li-Si-Zr-O Li(+) solid electrolyte showed EDL-induced hole density modulation over a range of up to three orders of magnitude, EDLT with a Li-La-Ti-O (LLTO) Li(+) solid electrolyte showed negligible enhancement, which indicates strong suppression of the EDL effect. Such suppression is attributed to charge neutralization in the LLTO, which is due to variation in the valence state of the Ti ions present. The method described is useful for quantitatively evaluating the EDL effect in various solid electrolytes. Nature Publishing Group UK 2021-08-06 /pmc/articles/PMC9814946/ /pubmed/36697812 http://dx.doi.org/10.1038/s42004-021-00554-7 Text en © The Author(s) 2021 https://creativecommons.org/licenses/by/4.0/Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/ (https://creativecommons.org/licenses/by/4.0/) .
spellingShingle Article
Tsuchiya, Takashi
Takayanagi, Makoto
Mitsuishi, Kazutaka
Imura, Masataka
Ueda, Shigenori
Koide, Yasuo
Higuchi, Tohru
Terabe, Kazuya
The electric double layer effect and its strong suppression at Li(+) solid electrolyte/hydrogenated diamond interfaces
title The electric double layer effect and its strong suppression at Li(+) solid electrolyte/hydrogenated diamond interfaces
title_full The electric double layer effect and its strong suppression at Li(+) solid electrolyte/hydrogenated diamond interfaces
title_fullStr The electric double layer effect and its strong suppression at Li(+) solid electrolyte/hydrogenated diamond interfaces
title_full_unstemmed The electric double layer effect and its strong suppression at Li(+) solid electrolyte/hydrogenated diamond interfaces
title_short The electric double layer effect and its strong suppression at Li(+) solid electrolyte/hydrogenated diamond interfaces
title_sort electric double layer effect and its strong suppression at li(+) solid electrolyte/hydrogenated diamond interfaces
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9814946/
https://www.ncbi.nlm.nih.gov/pubmed/36697812
http://dx.doi.org/10.1038/s42004-021-00554-7
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