Cargando…
Genetic Variation in Common Bunt Resistance in Synthetic Hexaploid Wheat
Common bunt (caused by Tilletia caries and T. Foetida) is a major wheat disease. It occurs frequently in the USA and Turkey and damages grain yield and quality. Seed treatment with fungicides is an effective method to control this disease. However, using fungicides in organic and low-income fields i...
Autores principales: | Mourad, Amira M. I., Morgounov, Alexey, Baenziger, P. Stephen, Esmail, Samar M. |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2022
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9824752/ https://www.ncbi.nlm.nih.gov/pubmed/36616131 http://dx.doi.org/10.3390/plants12010002 |
Ejemplares similares
-
Unlocking the novel genetic diversity and population structure of synthetic Hexaploid wheat
por: Bhatta, Madhav, et al.
Publicado: (2018) -
Genetic architecture of common bunt resistance in winter wheat using genome-wide association study
por: Mourad, Amira M. I., et al.
Publicado: (2018) -
Genome-Wide Association Study Reveals Novel Genomic Regions for Grain Yield and Yield-Related Traits in Drought-Stressed Synthetic Hexaploid Wheat
por: Bhatta, Madhav, et al.
Publicado: (2018) -
Primary hexaploid synthetics: Novel sources of wheat disease resistance
por: Shamanin, Vladimir, et al.
Publicado: (2019) -
Genetic Mapping of Resistance in Hexaploid Wheat for a Quarantine Disease: Karnal Bunt
por: Brar, Gurcharn S., et al.
Publicado: (2018)