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Temporal dynamics of charge buildup in cryo-electron microscopy

It is well known that insulating samples can accumulate electric charges from exposure to an electron beam. How the accumulation of charge affects imaging parameters and sample stability in transmission electron microscopy is poorly understood. To quantify these effects, it is important to know how...

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Detalles Bibliográficos
Autores principales: Schreiber, Makoto Tokoro, Maigné, Alan, Beleggia, Marco, Shibata, Satoshi, Wolf, Matthias
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Elsevier 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9826809/
https://www.ncbi.nlm.nih.gov/pubmed/36632442
http://dx.doi.org/10.1016/j.yjsbx.2022.100081