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Temporal dynamics of charge buildup in cryo-electron microscopy
It is well known that insulating samples can accumulate electric charges from exposure to an electron beam. How the accumulation of charge affects imaging parameters and sample stability in transmission electron microscopy is poorly understood. To quantify these effects, it is important to know how...
| Autores principales: | , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Elsevier
2022
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9826809/ https://www.ncbi.nlm.nih.gov/pubmed/36632442 http://dx.doi.org/10.1016/j.yjsbx.2022.100081 |