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Sequential Brush Grafting for Chemically and Dimensionally Tolerant Directed Self-Assembly of Block Copolymers
[Image: see text] We report a method for the directed self-assembly (DSA) of block copolymers (BCPs) in which a first BCP film deploys homopolymer brushes, or “inks”, that sequentially graft onto the substrate’s surface via the interpenetration of polymer molecules during the thermal annealing of th...
Autores principales: | , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
American Chemical Society
2022
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Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9837782/ https://www.ncbi.nlm.nih.gov/pubmed/36534025 http://dx.doi.org/10.1021/acsami.2c16508 |
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author | Chang, Boyce S. Loo, Whitney S. Yu, Beihang Dhuey, Scott Wan, Lei Nealey, Paul F. Ruiz, Ricardo |
author_facet | Chang, Boyce S. Loo, Whitney S. Yu, Beihang Dhuey, Scott Wan, Lei Nealey, Paul F. Ruiz, Ricardo |
author_sort | Chang, Boyce S. |
collection | PubMed |
description | [Image: see text] We report a method for the directed self-assembly (DSA) of block copolymers (BCPs) in which a first BCP film deploys homopolymer brushes, or “inks”, that sequentially graft onto the substrate’s surface via the interpenetration of polymer molecules during the thermal annealing of the polymer film on top of existing polymer brushes. By selecting polymer “inks” with the desired chemistry and appropriate relative molecular weights, it is possible to use brush interpenetration as a powerful technique to generate self-registered chemical contrast patterns at the same frequency as that of the domains of the BCP. The result is a process with a higher tolerance to dimensional and chemical imperfections in the guiding patterns, which we showcase by implementing DSA using homopolymer brushes for the guiding features as opposed to more robust cross-linkable mats. We find that the use of “inks” does not compromise the line width roughness, and the quality of the DSA as a lithographic mask is verified by implementing a robust “dry lift-off” pattern transfer. |
format | Online Article Text |
id | pubmed-9837782 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2022 |
publisher | American Chemical Society |
record_format | MEDLINE/PubMed |
spelling | pubmed-98377822023-01-14 Sequential Brush Grafting for Chemically and Dimensionally Tolerant Directed Self-Assembly of Block Copolymers Chang, Boyce S. Loo, Whitney S. Yu, Beihang Dhuey, Scott Wan, Lei Nealey, Paul F. Ruiz, Ricardo ACS Appl Mater Interfaces [Image: see text] We report a method for the directed self-assembly (DSA) of block copolymers (BCPs) in which a first BCP film deploys homopolymer brushes, or “inks”, that sequentially graft onto the substrate’s surface via the interpenetration of polymer molecules during the thermal annealing of the polymer film on top of existing polymer brushes. By selecting polymer “inks” with the desired chemistry and appropriate relative molecular weights, it is possible to use brush interpenetration as a powerful technique to generate self-registered chemical contrast patterns at the same frequency as that of the domains of the BCP. The result is a process with a higher tolerance to dimensional and chemical imperfections in the guiding patterns, which we showcase by implementing DSA using homopolymer brushes for the guiding features as opposed to more robust cross-linkable mats. We find that the use of “inks” does not compromise the line width roughness, and the quality of the DSA as a lithographic mask is verified by implementing a robust “dry lift-off” pattern transfer. American Chemical Society 2022-12-19 /pmc/articles/PMC9837782/ /pubmed/36534025 http://dx.doi.org/10.1021/acsami.2c16508 Text en © 2022 The Authors. Published by American Chemical Society https://creativecommons.org/licenses/by/4.0/Permits the broadest form of re-use including for commercial purposes, provided that author attribution and integrity are maintained (https://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Chang, Boyce S. Loo, Whitney S. Yu, Beihang Dhuey, Scott Wan, Lei Nealey, Paul F. Ruiz, Ricardo Sequential Brush Grafting for Chemically and Dimensionally Tolerant Directed Self-Assembly of Block Copolymers |
title | Sequential
Brush Grafting for Chemically and Dimensionally
Tolerant Directed Self-Assembly of Block Copolymers |
title_full | Sequential
Brush Grafting for Chemically and Dimensionally
Tolerant Directed Self-Assembly of Block Copolymers |
title_fullStr | Sequential
Brush Grafting for Chemically and Dimensionally
Tolerant Directed Self-Assembly of Block Copolymers |
title_full_unstemmed | Sequential
Brush Grafting for Chemically and Dimensionally
Tolerant Directed Self-Assembly of Block Copolymers |
title_short | Sequential
Brush Grafting for Chemically and Dimensionally
Tolerant Directed Self-Assembly of Block Copolymers |
title_sort | sequential
brush grafting for chemically and dimensionally
tolerant directed self-assembly of block copolymers |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9837782/ https://www.ncbi.nlm.nih.gov/pubmed/36534025 http://dx.doi.org/10.1021/acsami.2c16508 |
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