Spectral X-ray dark-field signal characterization from dual-energy projection phase-stepping data with a Talbot-Lau interferometer

Material-selective analysis of spectral X-ray imaging data requires prior knowledge of the energy dependence of the observed signal. Contrary to conventional X-ray imaging, where the material-specific attenuation coefficient is usually precisely known, the linear diffusion coefficient of the X-ray d...

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Detalles Bibliográficos
Autores principales: Taphorn, Kirsten, Kaster, Lennard, Sellerer, Thorsten, Hötger, Alexander, Herzen, Julia
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9840630/
https://www.ncbi.nlm.nih.gov/pubmed/36641492
http://dx.doi.org/10.1038/s41598-022-27155-1

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9840630/
https://www.ncbi.nlm.nih.gov/pubmed/36641492
http://dx.doi.org/10.1038/s41598-022-27155-1

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