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Determination of the Dielectric Constant of Niobium Oxide by Using Combined EIS and Ellipsometric Methods
Combining ellipsometric and EIS methods, the dielectric constant ε for the oxide Nb(2)O(5) at room temperature was determined. At first, the linear dependence between anodization voltage and oxide thickness was established in the form d = 2.14 (± 0.05) · U + 12.2 (± 1.7) nm in the range of anodizing...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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MDPI
2023
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9861748/ https://www.ncbi.nlm.nih.gov/pubmed/36676533 http://dx.doi.org/10.3390/ma16020798 |