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Accurate Crack Detection Based on Distributed Deep Learning for IoT Environment
Defects or cracks in roads, building walls, floors, and product surfaces can degrade the completeness of the product and become an impediment to quality control. Machine learning can be a solution for detecting defects effectively without human experts; however, the low-power computing device cannot...
Autores principales: | , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2023
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9862405/ https://www.ncbi.nlm.nih.gov/pubmed/36679655 http://dx.doi.org/10.3390/s23020858 |
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author | Kim, Youngpil Yi, Shinuk Ahn, Hyunho Hong, Cheol-Ho |
author_facet | Kim, Youngpil Yi, Shinuk Ahn, Hyunho Hong, Cheol-Ho |
author_sort | Kim, Youngpil |
collection | PubMed |
description | Defects or cracks in roads, building walls, floors, and product surfaces can degrade the completeness of the product and become an impediment to quality control. Machine learning can be a solution for detecting defects effectively without human experts; however, the low-power computing device cannot afford that. In this paper, we suggest a crack detection system accelerated by edge computing. Our system consists of two: Rsef and Rsef-Edge. Rsef is a real-time segmentation method based on effective feature extraction that can perform crack image segmentation by optimizing conventional deep learning models. Then, we construct the edge-based system, named Rsef-Edge, to significantly decrease the inference time of Rsef, even in low-power IoT devices. As a result, we show both a fast inference time and good accuracy even in a low-powered computing environment. |
format | Online Article Text |
id | pubmed-9862405 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2023 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-98624052023-01-22 Accurate Crack Detection Based on Distributed Deep Learning for IoT Environment Kim, Youngpil Yi, Shinuk Ahn, Hyunho Hong, Cheol-Ho Sensors (Basel) Article Defects or cracks in roads, building walls, floors, and product surfaces can degrade the completeness of the product and become an impediment to quality control. Machine learning can be a solution for detecting defects effectively without human experts; however, the low-power computing device cannot afford that. In this paper, we suggest a crack detection system accelerated by edge computing. Our system consists of two: Rsef and Rsef-Edge. Rsef is a real-time segmentation method based on effective feature extraction that can perform crack image segmentation by optimizing conventional deep learning models. Then, we construct the edge-based system, named Rsef-Edge, to significantly decrease the inference time of Rsef, even in low-power IoT devices. As a result, we show both a fast inference time and good accuracy even in a low-powered computing environment. MDPI 2023-01-11 /pmc/articles/PMC9862405/ /pubmed/36679655 http://dx.doi.org/10.3390/s23020858 Text en © 2023 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Kim, Youngpil Yi, Shinuk Ahn, Hyunho Hong, Cheol-Ho Accurate Crack Detection Based on Distributed Deep Learning for IoT Environment |
title | Accurate Crack Detection Based on Distributed Deep Learning for IoT Environment |
title_full | Accurate Crack Detection Based on Distributed Deep Learning for IoT Environment |
title_fullStr | Accurate Crack Detection Based on Distributed Deep Learning for IoT Environment |
title_full_unstemmed | Accurate Crack Detection Based on Distributed Deep Learning for IoT Environment |
title_short | Accurate Crack Detection Based on Distributed Deep Learning for IoT Environment |
title_sort | accurate crack detection based on distributed deep learning for iot environment |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9862405/ https://www.ncbi.nlm.nih.gov/pubmed/36679655 http://dx.doi.org/10.3390/s23020858 |
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