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Testing and Analysis Method of Low Remanence Materials for Magnetic Shielding Device

Magnetic shielding devices with a grid structure of multiple layers of highly magnetically permeable materials (such as permalloy) can achieve remanent magnetic fields at the nanotesla (nT) level or even lower. The remanence of the material inside the magnetic shield, such as the building materials...

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Detalles Bibliográficos
Autores principales: Cheng, Yuan, Luo, Yaozhi, Shen, Ruihong, Kong, Deyu, Zhou, Weiyong
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9862833/
https://www.ncbi.nlm.nih.gov/pubmed/36676419
http://dx.doi.org/10.3390/ma16020681
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author Cheng, Yuan
Luo, Yaozhi
Shen, Ruihong
Kong, Deyu
Zhou, Weiyong
author_facet Cheng, Yuan
Luo, Yaozhi
Shen, Ruihong
Kong, Deyu
Zhou, Weiyong
author_sort Cheng, Yuan
collection PubMed
description Magnetic shielding devices with a grid structure of multiple layers of highly magnetically permeable materials (such as permalloy) can achieve remanent magnetic fields at the nanotesla (nT) level or even lower. The remanence of the material inside the magnetic shield, such as the building materials used in the support structure, can cause serious damage to the internal remanence of the magnetic shield. Therefore, it is of great significance to detect the remanence of the materials used inside the magnetic shielding device. The existing test methods do not limit the test environment, the test process is vulnerable to additional magnetic field interference and did not consider the real results of the material in the weak magnetic environment. In this paper, a novel method of measuring the remanence of materials in a magnetic shielding cylinder is proposed, which prevents the interference of the earth’s magnetic field and reduces the measurement error. This method is used to test concrete components, composite materials and metal materials commonly applicated in magnetic shielding devices and determine the materials that can be used for magnetic shielding devices with 1 nT, 10 nT and 100 nT as residual magnetic field targets.
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spelling pubmed-98628332023-01-22 Testing and Analysis Method of Low Remanence Materials for Magnetic Shielding Device Cheng, Yuan Luo, Yaozhi Shen, Ruihong Kong, Deyu Zhou, Weiyong Materials (Basel) Article Magnetic shielding devices with a grid structure of multiple layers of highly magnetically permeable materials (such as permalloy) can achieve remanent magnetic fields at the nanotesla (nT) level or even lower. The remanence of the material inside the magnetic shield, such as the building materials used in the support structure, can cause serious damage to the internal remanence of the magnetic shield. Therefore, it is of great significance to detect the remanence of the materials used inside the magnetic shielding device. The existing test methods do not limit the test environment, the test process is vulnerable to additional magnetic field interference and did not consider the real results of the material in the weak magnetic environment. In this paper, a novel method of measuring the remanence of materials in a magnetic shielding cylinder is proposed, which prevents the interference of the earth’s magnetic field and reduces the measurement error. This method is used to test concrete components, composite materials and metal materials commonly applicated in magnetic shielding devices and determine the materials that can be used for magnetic shielding devices with 1 nT, 10 nT and 100 nT as residual magnetic field targets. MDPI 2023-01-10 /pmc/articles/PMC9862833/ /pubmed/36676419 http://dx.doi.org/10.3390/ma16020681 Text en © 2023 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Cheng, Yuan
Luo, Yaozhi
Shen, Ruihong
Kong, Deyu
Zhou, Weiyong
Testing and Analysis Method of Low Remanence Materials for Magnetic Shielding Device
title Testing and Analysis Method of Low Remanence Materials for Magnetic Shielding Device
title_full Testing and Analysis Method of Low Remanence Materials for Magnetic Shielding Device
title_fullStr Testing and Analysis Method of Low Remanence Materials for Magnetic Shielding Device
title_full_unstemmed Testing and Analysis Method of Low Remanence Materials for Magnetic Shielding Device
title_short Testing and Analysis Method of Low Remanence Materials for Magnetic Shielding Device
title_sort testing and analysis method of low remanence materials for magnetic shielding device
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9862833/
https://www.ncbi.nlm.nih.gov/pubmed/36676419
http://dx.doi.org/10.3390/ma16020681
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