A CMOS Image Readout Circuit with On-Chip Defective Pixel Detection and Correction

Images produced by CMOS sensors may contain defective pixels due to noise, manufacturing errors, or device malfunction, which must be detected and corrected at early processing stages in order to produce images that are useful to human users and image-processing or machine-vision algorithms. This pa...

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Detalles Bibliográficos
Autores principales: López-Portilla, Bárbaro M., Valenzuela, Wladimir, Zarkesh-Ha, Payman, Figueroa, Miguel
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9863635/
https://www.ncbi.nlm.nih.gov/pubmed/36679730
http://dx.doi.org/10.3390/s23020934

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9863635/
https://www.ncbi.nlm.nih.gov/pubmed/36679730
http://dx.doi.org/10.3390/s23020934

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