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A CMOS Image Readout Circuit with On-Chip Defective Pixel Detection and Correction
Images produced by CMOS sensors may contain defective pixels due to noise, manufacturing errors, or device malfunction, which must be detected and corrected at early processing stages in order to produce images that are useful to human users and image-processing or machine-vision algorithms. This pa...
Autores principales: | López-Portilla, Bárbaro M., Valenzuela, Wladimir, Zarkesh-Ha, Payman, Figueroa, Miguel |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2023
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9863635/ https://www.ncbi.nlm.nih.gov/pubmed/36679730 http://dx.doi.org/10.3390/s23020934 |
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